DS90UB914ATRHSTQ1 Datasheet, PDF (8/68 Pages) Texas Instruments – DS90UB913A-Q1/DS90UB914A-Q1 25 to100 MHz 10/12-Bit

DS90UB913A-Q1, DS90UB914A-Q1
SNLS443A – MAY 2013 – REVISED JUNE 2013
www.ti.com
ABSOLUTE MAXIMUM RATINGS ⁽¹⁾
Supply Voltage – V_DDn (1.8V)
Supply Voltage – V_DDIO
LVCMOS Input Voltage I/O Voltage
CML Driver I/O Voltage (V_DD)
CML Receiver I/O Voltage (V_DD)
Junction Temperature
Storage Temperature
Package Derating:
DS90UB913A-Q1 32L WQFN
θ_JA (based on 16 thermal vias)
θ_JC (based on 16 thermal vias)
Package Derating:
DS90UB914A-Q1 48L WQFN
θ_JA (based on 16 thermal vias)
θ_JC (based on 16 thermal vias)
ESD Rating (IEC 61000-4-2)
Air Discharge
(DOUT+, DOUT-, RIN+, RIN-)
Contact Discharge
(DOUT+, DOUT-, RIN+, RIN-)
ESD Rating (ISO10605)
ESD Rating (ISO10605)
Air Discharge
(DOUT+, DOUT-, RIN+, RIN-)
Contact Discharge
(DOUT+, DOUT-, RIN+, RIN-)
ESD Rating (HBM)
ESD Rating (CDM)
ESD Rating (MM)
−0.3V to +2.5V
−0.3V to +4.0V
−0.3V to + (VDDIO + 0.3V)
−0.3V to +(V_DD + 0.3V)
−0.3V to (V_DD + 0.3V)
+150°C
−65°C to +150°C
38.4 °C/W
6.9 °C/W
26.9 °C/W
4.4 °C/W
R_D = 330Ω, C_S = 150pF
≥±25 kV
≥±7 kV
R_D = 330Ω, C_S = 150/330pF
R_D = 2KΩ, C_S = 150/330pF
≥±15 kV
≥±8 kV
≥±8 kV
≥±1 kV
≥±250 V
For soldering specifications: see product folder at www.ti.com and www.ti.com/lit/an/snoa549c/snoa549c.pdf
(1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of
device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or
other conditions beyond those indicated in the Recommended Operating Conditions is not implied. The Recommended Operating
Conditions indicate conditions at which the device is functional; the device should not be operated beyond such conditions.
RECOMMENDED OPERATING CONDITIONS
Min
Supply Voltage (V_DDn)
LVCMOS Supply Voltage (V_DDIO)
OR
1.71
1.71
LVCMOS Supply Voltage (V_DDIO)
3.0
OR
LVCMOS Supply Voltage (V_DDIO) Only Serializer
Supply Noise ⁽¹⁾
2.52
V_DDn (1.8V)
V_DDIO (1.8V)
V_DDIO (3.3V)
Operating Free Air Temperature (T_A)
-40
PCLK Clock Frequency
25
Nom
1.8
1.8
3.3
2.8
+25
Max
1.89
1.89
3.6
3.08
25
25
50
+105
100
Units
V
V
V
V
mVp-p
mVp-p
mVp-p
°C
MHz
(1) Supply noise testing was done with minimum capacitors (as shown on Figure 49, Figure 47, Figure 50, and Figure 48 on the PCB. A
sinusoidal signal is AC coupled to the VDDn (1.8V) supply with amplitude = 25 mVp-p measured at the device VDDn pins. Bit error rate
testing of input to the Ser and output of the Des with 10 meter cable shows no error when the noise frequency on the Ser is less than 1
MHz. The Des on the other hand shows no error when the noise frequency is less than 750 kHz.
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