S71GL032A Datasheet, PDF (66/102 Pages) SPANSION – Stacked Multi-Chip Product (MCP) Flash Memory and RAM

Advance Information
Test Conditions
Device
Under
Test
3.3 V
2.7 kΩ
C_L
6.2 kΩ
Note: Diodes are IN3064 or equivalent.
Figure 11. Test Setup
Table 24. Test Specifications
Test Condition
All Speeds
Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0 or V_CC
V
Input timing measurement
reference levels (See Note)
0.5 V_CC
V
Output timing measurement
reference levels
0.5 V_CC
V
Key to Switching Waveforms
Waveform
Inputs
Steady
Outputs
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
VCC
0.0 V
Input 0.5 VCC
Measurement Level
0.5 VCC Output
Figure 12. Input Waveforms and Measurement Levels
66
S71GL032A Based MCPs
S71GL032A_00_A0 March 31, 2005