K4C89183AF Datasheet, PDF (23/55 Pages) Samsung semiconductor – 288Mb x18 Network-DRAM2 Specification

K4C89183AF
Mode Register Table
Regular Mode Register (Notes : 1)
Address
Register
BA1^*1
0
BA0^*1
0
A14-A8
0
A7
Test Mode (TE)
0
Regular (Default)
1
Test Mode Entry
A6
A5
A4
CAS Latency (CL)
0
0
X
Reserved ^*2
0
1
0
Reserved ^*2
0
1
1
Reserved ^*2
1
0
0
4
1
0
1
5
1
1
0
6
1
1
1
Reserved ^*2
A7^*3
A6-A4
A3
TM
CL
BT
A3
Burst Type (BT)
0
Sequential
1
Interleave
A2-A0
BL
A2
A1
A0
Burst Length (BL)
0
0
0
Reserved ^*2
0
0
1
Reserved ^*2
0
1
0
4
0
1
1
1
X
X
Reserved ^*2
Extended Mode Register (Notes : 4)
Address
Register
BA1^*4
0
BA0^*4
1
A14-A7
0
A6~A5
SS
A4-A3
DIC(QS)
A2~A1
DIC(DQ)
A0^*5
DS
A6 A5
Strobe Select
0
0
Reserved^*2
0
1
Reserved^*2
1
0
Unidirectional DS/QS
1
1 Unidirectional DS/Free Running QS
QS
A4 A3
00
01
10
11
DQ
A2 A1
00
01
10
11
Output Driver Impedance Control
(DIC)
Normal Output Driver
Strong Output Driver
Weak Output Driver
Reserved
Note : 1. Regular Mode Register Is Chosen Using the combination of BA0 = 0 and BA1 = 0.
2. "Reserved" places in Regular Mode Register should not be set.
A0
3. A7 in Regular Mode Register must be set to "0"(Low state).
0
Because Test Mode is specific mode for supplier.
4. Extended Mode Register is chosen using the Combination of BA0 = 1 and BA1 = 0.
1
5. A0 in Extended Mode Register must be set to "0" to enable DLL for normal operation.
DLL Switch (DS)
DLL Enable
DLL Disable
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REV. 0.7 Jan. 2005