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K4E661612D Datasheet, PDF (17/36 Pages) Samsung semiconductor – CMOS DRAM
Industrial Temperature
K4E661612D,K4E641612D
LOWER BYTE WRITE CYCLE ( OE CONTROLLED WRITE )
NOTE : D OUT = O P E N
V IH -
RAS
V IL -
V IH -
UCAS
V IL -
VIH -
LCAS
V IL -
V IH -
A
V IL -
VIH -
W
V IL -
V IH -
OE
V IL -
DQ0 ~ DQ7
V IH -
V IL -
DQ8 ~ DQ15
VIH -
V IL -
t RC
tR A S
tCRP
tCRP
tRCD
tRAD
tASR
tR A H
ROW
ADDRESS
tASC
tCSH
tR S H
tCAS
t CAH
COLUMN
ADDRESS
t RAL
tC W L
tRWL
tW P
tOED
tOEH
tD S
tDH
DATA-IN
CMOS DRAM
tR P
tR P C
tC R P
D o n ′t care
Undefined