306666-11 Datasheet, PDF (28/99 Pages) Numonyx B.V – Numonyx StrataFlash Embedded Memory

P30
7.0
AC Characteristics
7.1
AC Test Conditions
Figure 11: AC Input/Output Reference Waveform
V_CCQ
Input V_CCQ/2
Test Points
V_CCQ/2 Output
0V
IO_REF.WMF
Note: AC test inputs are driven at V_CCQ for Logic "1" and 0 V for Logic "0." Input/output timing begins/ends at V_CCQ/2. Input rise
and fall times (10% to 90%) < 5 ns. Worst case speed occurs at V_CC = V_CCMin.
Figure 12: Transient Equivalent Testing Load Circuit
Device
Under Test
Out
C_L
Notes:
1.
See the following table for component values.
2.
Test configuration component value for worst-case speed conditions.
3.
C_L includes jig capacitance.
.
Table 14: Test Configuration Component Value For Worst Case Speed Conditions
Test Configuration
V_CCQMin Standard Test
C_L (pF)
30
Figure 13: Clock Input AC Waveform
V_IH
CLK [C]
V_IL
R202
R201
R203
Datasheet
28
November 2007
Order Number: 306666-11