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CP3BT26 Datasheet, PDF (246/278 Pages) National Semiconductor (TI) – Reprogrammable Connectivity Processor with Bluetooth-R, USB, and CAN Interfaces
30.5 FLASH MEMORY ON-CHIP PROGRAMMING
(Guaranteed by design.)
Symbol
Parameter
tSTART
tTRAN
tPROG
tPERASE
tMERASE
tEND
tMEND
tRCV
tHV
tHV
Program/Erase to NVSTR Setup Timea
(NVSTR = Non-Volatile Storage
NVSTR to Program Setup Timeb
Programming Pulse Widthc
Page Erase Pulse Widthd
Module Erase Pulse Widthe
NVSTR Hold Timef
NVSTR Hold Time (Module Erase)g
Recovery Timeh
Cumulative Program High Voltage Period For
Each Row After Erasei
Write/Erase Endurance
Data Retention
Conditions
128K program blocks
8K data block
25°C
Min
5
10
20
20
200
5
100
1
-
-
20,000
100
Max Units
- µs
- µs
40 µs
- ms
- ms
- µs
- µs
- µs
8 ms
4 ms
- cycles
- years
a. Program/erase to NVSTR Setup Time is determined by the following equation:
tSTART = Tclk × (FTDIV + 1) × (FTSTART + 1), where Tclk is the System Clock period, FTDIV is the contents of
the FMPSR or FSMPSR register, and FTSTART is the contents of the FMSTART or FSMSTART register
b. NVSTR to Program Setup Time is determined by the following equation:
tTRAN = Tclk × (FTDIV + 1) × (FTTRAN + 1), where Tclk is the System Clock period, FTDIV is the contents of
the FMPSR or FSMPSR register, and FTTRAN is the contents of the FMTRAN or FSMTRAN register
c. Programming Pulse Width is determined by the following equation:
tPROG = Tclk × (FTDIV + 1) × 8 × (FTPROG + 1), where Tclk is the System Clock period, FTDIV is the con-
tents of the FMPSR or FSMPSR register, and FTPROG is the contents of the FMPROG or FSMPROG regis-
ter
d. Page Erase Pulse Width is determined by the following equation:
tPERASE = Tclk × (FTDIV + 1) × 4096 × (FTPER + 1), where Tclk is the System Clock period, FTDIV is the
contents of the FMPSR or FSMPSR register, and FTPER is the contents of the FMPERASE or FSMPER-
ASE register
e. Module Erase Pulse Width is determined by the following equation:
tMERASE = Tclk × (FTDIV + 1) × 4096 × (FTMER + 1), where Tclk is the System Clock period, FTDIV is the
contents of the FMPSR or FSMPSR register, and FTMER is the contents of the FMMERASE0 or
FSMMERASE0 register
f. NVSTR Hold Time is determined by the following equation:
tEND = Tclk × (FTDIV + 1) × (FTEND + 1), where Tclk is the System Clock period, FTDIV is the contents of the
FMPSR or FSMPSR register, and FTEND is the contents of the FMEND or FSMEND register
g. NVSTR Hold Time (Module Erase) is determined by the following equation:
tMEND = Tclk × (FTDIV + 1) × 8 × (FTMEND + 1), where Tclk is the System Clock period, FTDIV is the con-
tents of the FMPSR or FSMPSR register, and FTMEND is the contents of the FMMEND or FSMMEND regis-
ter
h. Recovery Time is determined by the following equation:
tRCV = Tclk × (FTDIV + 1) × (FTRCV + 1), where Tclk is the System Clock period, FTDIV is the contents of the
FMPSR or FSMPSR register, and FTRCV is the contents of the FMRCV or FSMRCV register
i. Cumulative program high voltage period for each row after erase tHV is the accumulated duration a flash cell
is exposed to the programming voltage after the last erase cycle.
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