PIC24HJ12GP201_11 Datasheet, PDF (195/262 Pages) Microchip Technology – High-Performance, 16-bit Microcontrollers 5-cycle latency

PIC24HJ12GP201/202
TABLE 22-9: DC CHARACTERISTICS: I/O PIN INPUT SPECIFICATIONS (CONTINUED)
DC CHARACTERISTICS
Standard Operating Conditions: 3.0V to 3.6V
(unless otherwise stated)
Operating temperature -40°C ≤TA ≤ +85°C for Industrial
-40°C ≤TA ≤+125°C for Extended
Param
No.
Symbol
Characteristic
Min Typ⁽¹⁾ Max Units
Conditions
IICL
Input Low Injection Current
DI60a
0
All pins except VDD, VSS, AVDD,
— -5^(5,8) mA ^{AVSS, MCLR, VCAP, SOSCI,}
and SOSCO
IICH
Input High Injection Current
DI60b
All pins except VDD, VSS, AVDD,
0
—
+5^(6,7,8)
mA
AVSS, MCLR, VCAP, SOSCI,
SOSCO, and digital 5V-tolerant
designated pins
∑IICT
DI60c
Total Input Injection Current
(sum of all I/O and control
pins)
-20⁽⁹⁾
— +20⁽⁹⁾ mA Absolute instantaneous sum of
all ± input injection currents
from all I/O pins
( | IICL + | IICH | ) ≤ ∑IICT
Note 1: Data in “Typ” column is at 3.3V, 25°C unless otherwise stated.
2: The leakage current on the MCLR pin is strongly dependent on the applied voltage level. The specified
levels represent normal operating conditions. Higher leakage current may be measured at different input
voltages.
3: Negative current is defined as current sourced by the pin.
4: See “Pin Diagrams” for a list of 5V tolerant pins.
5: VIL source < (VSS – 0.3). Characterized but not tested.
6: Non-5V tolerant pins VIH source > (VDD + 0.3), 5V tolerant pins VIH source > 5.5V. Characterized but not
tested.
7: Digital 5V tolerant pins cannot tolerate any “positive” input injection current from input sources > 5.5V.
8: Injection currents > | 0 | can affect the ADC results by approximately 4-6 counts.
9: Any number and/or combination of I/O pins not excluded under IICL or IICH conditions are permitted pro-
vided the mathematical “absolute instantaneous” sum of the input injection currents from all pins do not
exceed the specified limit. Characterized but not tested.
10: These parameters are characterized, but not tested.
© 2007-2011 Microchip Technology Inc.
DS70282E-page 195