ISL78610 Datasheet, PDF (68/98 Pages) Intersil Corporation – Multi-Cell Li-Ion Battery Manager

ISL78610
SCAN MIXED
The Scan Mixed command performs all the functions of the Scan
Voltages command but interposes a measurement of the ExT1
input between the cell 7 and cell 6 measurements.
TABLE 32. SCAN MIXED FUNCTION TIMING – DAISY CHAIN MASTER
OR STAND-ALONE DEVICE
EVENT
TYP (µs) MAX (µs)
Sample Cell 12
17
19
Sample Cell 11
Sample Cell 10
Sample Cell 9
Sample Cell 8
38
42
59
65
80
88
101
111
Sample Cell 7
122
134
Complete Cell Voltage Capture 12-7
Sample Ext1
176
194
Complete Ext1 Capture
192
211
Sample Cell 6
207
228
Sample Cell 5
228
251
Sample Cell 4
Sample Cell 3
Sample Cell 2
Sample Cell 1
249
274
270
297
291
321
312
344
Complete Cell Voltage Capture 6-1
Sample VBAT
367
404
Complete VBAT Voltage Capture
381
419
Load Registers
829
911
SCAN WIRES
The Scan Wires command initiates a sequence in which each
input is loaded in turn with a test current for a duration of 4.5ms
(default). At the end of this time the input voltage is checked and
the test current is turned off. The result of each test is recorded
and the Open-wire Fault and Fault Status registers are updated
(data latched) at the conclusion of the tests.
TABLE 33. SCAN WIRES FUNCTION TIMING – DAISY CHAIN MASTER
OR STAND-ALONE DEVICE
ELAPSED TIME (ms)
EVENT
TYP
MAX
Turn On VC0 Current
0.03
0.05
Test VC0
4.5
5.0
Turn On Vc1 Current
4.6
5.1
Test VC1
9.1
10.0
~
Turn On VC12 Current
54.9
60.3
Test VC12
59.4
65.3
Load Registers
59.4
65.3
SCAN ALL
The Scan All command combines the Scan Voltages, Scan Wires
and Scan Temperatures commands into a single scan function.
TABLE 34. SCAN ALL FUNCTION TIMING – DAISY CHAIN MASTER OR
STAND-ALONE DEVICE
ELAPSED TIME (ms)
EVENT
TYP
MAX
Start Scan Voltages
0
0
Start Scan Wires
0.8
0.9
Start Scan Temperatures
60.1
66.2
Complete Sequence
62.8
69.1
MEASURE COMMAND
Single parameter measurements of the cell voltages, pack
voltage, ExT1 to ExT4 inputs, IC temperature and reference
voltage are performed using the Measure command.
TABLE 35. VARIOUS MEASURE FUNCTION TIMINGS – DAISY CHAIN
MASTER OR STAND-ALONE DEVICE
ELAPSED TIME (µs)
EVENT
TYP
MAX
Measure Cell Voltage
178
196
Measure Pack Voltage
122
134
Measure ExT input
2517
2768
Measure IC Temperature
106
116
Measure Reference Voltage
106
116
Response Timing Tables
Response timing depends on the number of devices in the stack,
the position of the device in the stack, and how many bytes are
read back. There are four “sizes” of read responses. There are the
following four types of responses:
1. Single register read or ACK/NAK responses, where four bytes
are returned by the Read Command
2. Read All Voltage response, which returns 40 bytes
3. Read all Temps or Read All Faults responses, which returns
22 bytes
4. Read All Setup Registers response, which returns 43 bytes
In the Tables 36 through 41, the master, middle, and top device
response times for any number of daisy chain devices are
included with the command timing for that configuration. The
right hand column shows the total time to complete the read
operation. This is calculated as follows:
N  T_COMMAND + N – 2  T_MID + T_TOP + T_MASTER
(EQ. 4)
Where N = Number of devices in the stack.
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FN8830.1
June 16, 2016