MB81N643289 Datasheet, PDF (52/64 Pages) Fujitsu Component Limited. – 8 x 256K x 32 BIT DOUBLE DATA RATE FCRAMTM

MB81N643289-50/-60 Preliminary (AE1E)
s SCITT TEST MODE
ABOUT SCITT
SCITT (Static Component Interconnection Test Technology) is an XNOR circuit based test technology that is used
for testing interconnection between SDRAM and SDRAM controller on the printed circuit boards. SCITT provides
inexpensive board level test mode in combination with boundary-scan. The basic idea is simple, consider all output
of SDRAM as output of XNOR circuit and each output pin has a unique mapping on the input of SDRAM. The ideal
schematic block diagram is as shown below.
µC
Boundary
Scan
ASIC
TEST
Control
xAddress
Bus
XNOR
SDRAM
CORE
Data Bus
TEST Control : CAS, CS, PD
xAddress Bus : A0 to A10, BA0 to BA2, RAS, DM0 to DM3, CLK, CLK, WE
Data Bus
: DQ0 to DQ31, DQS0 to DQS3
It is static and provides easy test pattern that result in a high diagnostic resolution for detecting all open/short faults.
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