MB81N643289 Datasheet, PDF (36/64 Pages) Fujitsu Component Limited. – 8 x 256K x 32 BIT DOUBLE DATA RATE FCRAMTM

MB81N643289-50/-60 Preliminary (AE1E)
s AC CHARACTERISTICS (continued)
Fig. 7 – EXAMPLE OF AC TEST LOAD CIRCUIT (2.5 V CMOS Source Termination)
Output
R = 50 Ω
VDDQ/2
CL = 20 pF
Note: By adding appropriate correlation factors to the test conditions, tAC and tOH measured when the
Output is coupled to the Output Load Circuit are within specifications.
AC TEST CONDITIONS
Parameters
Single-end Input
Input High Level
Input Low Level
Input Reference Level
Input Slew Rate
Differential Input (CLK and CLK)
Input Reference Level
Input Level
Input Slew Rate
Symbol
VIH
VIL
VREF
SLEW
Vr
VSWING
SLEW
Value
VREF+0.35
VREF-0.35
VDDQ/2
1.0
Vx(AC)
0.7
1.0
VX means the actual cross point between CLK and CLK input.
Unit
V
V
V
V/ns
V
V
V/ns
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