CD00237391 Datasheet, PDF (95/177 Pages) STMicroelectronics – ARM-based 32-bit MCU, 150DMIPs, up to 1 MB Flash/128+4KB RAM

STM32F20xxx
Electrical characteristics
Table 42. Electrical sensitivities
Symbol
Parameter
Conditions
LU
Static latch-up class
T_A = +105 °C conforming to JESD78A
Class
II level A
5.3.15
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V_SS or
above V_DD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 43.
Table 43. I/O current injection susceptibility
Symbol
Description
Functional susceptibility
Negative
Positive
Unit
injection
injection
Injected current on all FT pins
I_INJ
Injected current on any other pin
–5
+0
mA
–5
+5
Doc ID 15818 Rev 9
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