CD00237391 Datasheet, PDF (122/177 Pages) STMicroelectronics – ARM-based 32-bit MCU, 150DMIPs, up to 1 MB Flash/128+4KB RAM

Electrical characteristics
STM32F20xxx
Figure 53. 12-bit buffered /non-buffered DAC
Buffered/Non-buffered DAC
Buffer(1)
12-bit
digital to
analog
converter
DACx_OUT
R _LOAD
C _LOAD
ai17157
1. The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
5.3.22 Temperature sensor characteristics
Table 67. TS characteristics
Symbol
Parameter
Min Typ
T_L(1)
V_SENSE linearity with temperature
Avg_Slope⁽¹⁾ Average slope
V₂₅₍₁₎
t_START(2)
Voltage at 25 °C
Startup time
T_{S_temp(3)(2)}
ADC sampling time when reading the
temperature
1°C accuracy
-
±1
-
2.5
-
0.76
-
6
10
-
1. Based on characterization, not tested in production.
2. Guaranteed by design, not tested in production.
3. Shortest sampling time can be determined in the application by multiple iterations.
Max Unit
±2
°C
mV/°C
V
10
µs
-
µs
5.3.23
V_BAT monitoring characteristics
Table 68. V_BAT monitoring characteristics
Symbol
Parameter
Min Typ
R
Q
Er⁽¹⁾
T_{S_vbat(2)(2)}
Resistor bridge for V_BAT
Ratio on V_BAT measurement
Error on Q
ADC sampling time when reading the V_BAT
1mV accuracy
-
50
-
2
–1
-
5
-
1. Guaranteed by design, not tested in production.
2. Shortest sampling time can be determined in the application by multiple iterations.
Max
-
-
+1
-
Unit
KΩ
%
µs
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Doc ID 15818 Rev 9