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CD00191174 Datasheet, PDF (79/112 Pages) STMicroelectronics – High-density access line, ARM-based 32-bit MCU
STM32F101xC, STM32F101xD, STM32F101xE
Electrical characteristics
5.3.13
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below VSS or
above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in Table 45
Table 45. I/O current injection susceptibility
Symbol
Description
Functional susceptibility
Negative
Positive
Unit
injection
injection
Injected current on OSC_IN32,
OSC_OUT32, PA4, PA5, PC13
IINJ
Injected current on all FT pins
Injected current on any other pin
-0
+0
-5
+0
mA
-5
+5
Doc ID 14610 Rev 8
79/112