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UPSD3212A Datasheet, PDF (144/163 Pages) STMicroelectronics – Flash Programmable System Devices with 8032 MCU with USB and Programmable Logic
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uPSD3212A, uPSD3212C, uPSD3212CV
Table 121. External Data Memory AC Characteristics (with the 3V MCU Module)
Symbol
Parameter(1)
24MHz Oscillator
Min
Max
Variable Oscillator
1/tCLCL = 8 to 24MHz
Unit
Min
Max
tRLRH
RD pulse width
180
6tCLCL – 70
ns
tWLWH WR pulse width
180
6tCLCL – 70
ns
tLLAX2 Address hold after ALE
56
2tCLCL – 27
ns
tRHDX RD to valid data in
118
5tCLCL – 90 ns
tRHDX Data hold after RD
0
0
ns
tRHDZ Data float after RD
63
2tCLCL – 20 ns
tLLDV
ALE to valid data in
200
8tCLCL – 133 ns
tAVDV
Address to valid data in
220
9tCLCL – 155 ns
tLLWL
ALE to WR or RD
75
175
3tCLCL – 50 tCLCL + 50 ns
tAVWL Address valid to WR or RD
67
4tCLCL – 97
ns
tWHLH WR or RD High to ALE High
17
67
tCLCL – 25
tCLCL + 25
ns
tQVWX Data valid to WR transition
5
tCLCL – 37
ns
tQVWH Data set up before WR
170
7tCLCL – 122
ns
tWHQX Data hold after WR
15
tCLCL – 27
ns
tRLAZ
Address float after RD
0
0
ns
Note: 1. Conditions (in addition to those in Table 110., page 133, VCC = 3.0 to 3.6V): VSS = 0V; CL for Port 0, ALE and PSEN output is 100pF,
for 5V devices, and 50pF for 3V devices; CL for other outputs is 80pF, for 5V devices, and 50pF for 3V devices)
Table 122. A/D Analog Specification
Symbol
Parameter
AVREF
Analog Power Supply Input
Voltage Range
VAN
Analog Input Voltage Range
IAVDD
Current Following between VCC
and VSS
CAIN
Overall Accuracy
NNLE
Non-Linearity Error
NDNLE Differential Non-Linearity Error
NZOE
Zero-Offset Error
NFSE
Full Scale Error
NGE
Gain Error
TCONV Conversion Time
Test Condition
at 8MHz clock
Min.
Typ.
Max.
Unit
VSS
VSS – 0.3
VCC
V
AVREF + 0.3
V
200
µA
±2
l.s.b.
±2
l.s.b.
±2
l.s.b.
±2
l.s.b.
±2
l.s.b.
±2
l.s.b.
20
µs
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