MT40A1G4RH-083E Datasheet, PDF (319/365 Pages) Micron Technology – 4Gb: x4, x8, x16 DDR4 SDRAM

4Gb: x4, x8, x16 DDR4 SDRAM
Current Specifications – Patterns and Test Conditions
Table 140: I_DD2NT and I_DDQ2NT Measurement – Loop Pattern¹
Data³
0
0
1
2
3
1
4–7
2 8–11
3 12–15
4 16–19
5 20–23
6 24–27
7 28–31
8 32–35
9 36–39
10 40–43
11 44–47
12 48–51
13 52–55
14 56–59
15 60–63
D 10000000000000
–
D 10000000000000
–
D_n 1 1 1 1 1 0 3 3 0 0 0 7 F 0
–
D_n 1 1 1 1 1 0 3 3 0 0 0 7 F 0
–
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 1, use BA[1:0] = 1 instead
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 0, use BA[1:0] = 2 instead
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 1, use BA[1:0] = 3 instead
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 0, use BA[1:0] = 1 instead
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 1, use BA[1:0] = 2 instead
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 0, use BA[1:0] = 3 instead
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 1, use BA[1:0] = 0 instead
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 2, use BA[1:0] = 0 instead⁴
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 3, use BA[1:0] = 1 instead⁴
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 2, use BA[1:0] = 2 instead⁴
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 3, use BA[1:0] = 3 instead⁴
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 2, use BA[1:0] = 1 instead⁴
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 3, use BA[1:0] = 2 instead⁴
Repeat sub-loop 0 with ODT = 0, use BG[1:0] = 2, use BA[1:0] = 3 instead⁴
Repeat sub-loop 0 with ODT = 1, use BG[1:0] = 3, use BA[1:0] = 0 instead⁴
Notes:
1. DQS_t, DQS_c are V_SSQ.
2. BG1 is a "Don't Care" for x16 devices.
3. DQ signals are V_SSQ.
4. For x4 and x8 only.
09005aef84af6dd0
4gb_ddr4_dram.pdf - Rev. G 1/17 EN
319
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