N25Q128A11B1241F Datasheet, PDF (182/185 Pages) Micron Technology – 128-Mbit, 1.8 V, multiple I/O, 4-Kbyte subsector erase on boot sectors, XiP enabled, serial flash memory with 108 MHz SPI bus interface

Ordering information
16 Ordering information
N25Q128 - 1.8 V
Note:
For further information on line items not listed here or on any aspect of this device, please
contact your nearest Numonyx Sales Office.
Table 38. Ordering information scheme
Example:
N25Q128 A 1 1 B F8 4 0 E
Device type
N25Q = serial Flash memory, Quad I/O, XiP
Device density
128 = 128 Mbit
Technology
A = 65 nm
Feature set
1 = Byte addressability, Hold pin, Numonyx XiP
2 = Byte addressability, Hold pin, Basic XiP
3 = Byte addressability, Reset pin, Numonyx XiP
4 = Byte addressability, Reset pin, Basic XiP
Operating voltage
1 = VCC = 1.7 V to 2 V
Block Structure
B = Bottom
T = Top
E = Uniform (no boot sectors)
Package
F8 = VDFPN8 8 x 6 mm (MLP8) (RoHS compliant)
SF = SO16 (300 mils width) (RoHS compliant)
12 = TBGA24 6 x 8 mm (RoHS compliant)
Temperature and test flow
4 = Industrial temperature range, –40 to 85 °C
Device tested with standard test flow
A = Automotive temperature range, –40 to 125 °C
Device tested with high reliability certified test flow
H = Industrial temperature range, –40 to 85 °C
Device tested with high reliability certified test flow
Security features ⁽¹⁾
0 = No extra security
Packing options
E = Tray packing
F = Tape and reel packing
G = Tube packing
1. Additional secure options are available upon customer request.
182/185