GW80314GSSL7NK Datasheet, PDF (85/88 Pages) Intel Corporation – Intel® GW80314 I/O Companion Chip

Intel® GW80314 I/O Companion Chip
Electrical Specifications
4.6
AC Test Conditions
Table 41 and Figure 14 through Figure 17 summarize the AC test and measurement conditions to
be used for the GW80314.
Table 41. AC Measurement Conditions
Symbol
PCI-X
PCI
DDR
Intel XScale^®
Microprocessor
GigE
V_tch
V_tcl
V_th
V_tl
V_test
V_trise
V_fall
V_max
Slew Rate
0.6*V_CC33
0.2*V_CC33
0.6*V_CC33
0.25*V_CC33
0.4*V_CC33
0.285*V_CC33
0.615*V_CC33
0.4*V_CC33
1-6
0.6*V_CC33
0.2*V_CC33
0.6*V_CC33
0.2*V_CC33
0.4*V_CC33
0.285*V_CC33
0.615*V_CC33
0.4*V_CC33
1-6
-
-
2.0
0.5
1.25
1.25
1.25
1.5
1.5
0.6*V_CC33
0.2*V_CC33
0.6*V_CC33
0.2*V_CC33
0.4*V_CC33
0.285*V_CC33
0.615*V_CC33
0.4*V_CC33
1.5
NOTE: Input signal slew rate is measured between V_IL and V_IH.
0.6*V_CC33
0.2*V_CC33
0.6*V_CC33
0.2*V_CC33
0.4*V_CC33
0.285*V_CC33
0.615*V_CC33
0.4*V_CC33
1.5
Units
V
V
V
V
V
V
V
V
V/ns
Notes
1
Figure 14. AC Test Load for all Signals Except PCI and DDR SDRAM
Output
50pF
Test
Point
Figure 15. PCI/PCI-X T_OV(max) Rising Edge AC Test Load
Test
Point
Output
25Ω
10pF
Datasheet
85