GW80314GSSL7NK Datasheet, PDF (81/88 Pages) Intel Corporation – Intel® GW80314 I/O Companion Chip

Intel® GW80314 I/O Companion Chip
Electrical Specifications
4.4.9
Boundary Scan Test Signal Timings
Table 40. Boundary Scan Test Signal Timings
Symbol
Parameter
Min.
Max.
Units
Notes
T_BSF TCK Frequency
T_BSCH TCK High Time
0
10
MHz
50
-
ns
Measured
at 1.5V, 1
T_BSCL TCK Low Time
50
-
ns
Measured
at 1.5V, 1
T_BSCR TCK Rise Time
-
25
ns
0.8V to
2.0V, 1
T_BSCF TCK Fall Time
-
25
ns
2.0V to
0.8V, 1
T_SIS1 Input Setup to TCK
10
-
ns
4
T_BSIH1 Input Hold from TCK
10
-
ns
4
T_BSOV1 TDO Output Valid Delay from falling edge of TCK.
-
15
ns
2, 3
T_OF1 TDO Output Float Delay from falling edge of TCK
-
15
ns
2, 5
NOTES:
1. Not tested.
2. Outputs precharged to V_CC5.
3. See Figure 10.
4. See Figure 9.
5. A float condition occurs when the output current becomes less than I_LO. Float delay is not tested. See Figure 10.
Datasheet
81