IBIS4-6600 Datasheet, PDF (57/63 Pages) Cypress Semiconductor – High resolution 6.6 M Pixel Rolling shutter CMOS Image sensor

IBIS4-6600
Datasheet
7 Boundary scan test structures
Table 20 summarizes the pins that can be used to scan through internal nodes. In case
testing is not needed, these pins can be left floating.
Table 21: Boundary scan pins
Boundary scan pins
64 BS_RESET
input Boundary scan: reset
65 BS_CLOCK
input Boundary scan: clock
66 BS_DIN
input Boundary scan: in
67 BS_BUS
output Boundary scan: bus
The following signals can be connected to the bus (make sure to have only one 1 in
the scan registers at any time) (see Table 220).
Table 22: Internal signals that can be connected to the boundary scan bus.
Internal signals
1 eos_yl_shift 16 sub_y<3> 31
data<3>
2 clk_x_seq 17 sub_y<4> 32
data<2>
3 sync_x_seq 18 sub_y<5> 33
data<1>
4 clk_y_seq 19 address<3> 34
data<0>
5 sync_yl_seq 20 address<2> 35 eos_yr_shift
6 reset_seq 21 address<1> 36 eos_x_shift
7 tri_l_seq 22 address<0> 37 sync_yr_shift
8 select_seq 23 data<11> 38 tri_r_seq
9 sub_x<1> 24 data<10> 39
cal_seq
10 sub_x<2> 25 data<9> 40 slowfast_seq
11 sub_x<3> 26 data<8> 41 black_seq
12 sub_x<4> 27 data<7> 42 precharge_seq
13 sub_x<5> 28 data<6> 43 sample_S_seq
14 sub_y<1> 29 data<5> 44 sample_R_seq
15 sub_y<2> 30 data<4>
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