AMIS-53000 Datasheet, PDF (95/99 Pages) AMI SEMICONDUCTOR – Frequency Agile Transceiver

AMIS-53000 Frequency Agile Transceiver
Data Sheet
9.2.12. Digital Test MUX C
Table 117: Digital Test MUX C - 0X4D [77]
Bit Test Pin
Comment
1111
1110
1101
7:4 ^{MUX to}
Data SSN
1111 - 0000
1100
1011
1010
1001
1000
Encoder in
Decoder in
EE BIST good
EE low voltage
detect
CPENA
ROM BIST done
ROM BIST bad
RAM BIST done
0111
0110
0101
0100
0011
0010
0001
0000
RAMBist bad
EE BIST done
EE BIST bad
Busy
Instruction enable
Bandgap power down
XTAL
Data SSN normal
mode
3:0
1111- 0000
9.2.13. Digital Test Mode A
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.14. Digital Test Mode B
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.15. Digital Test Mode C
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.16. Digital Test Mode D
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.17. Memory Test Mode Address
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.18. Memory Test Mode Data
This register is used for factory testing of the AMIS-53000 and has no user functions.
AMI Semiconductor – Aug. 05, Rev. 1.0
95
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