AMIS-53000 Datasheet, PDF (93/99 Pages) AMI SEMICONDUCTOR – Frequency Agile Transceiver

AMIS-53000 Frequency Agile Transceiver
Data Sheet
9.2.4. PLL Test Modes
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.5. Power Down RF Sections
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.6. Analog Test Mode
Digital Pad Test: All digital pads except system clock out, and xInterrupt are 1mA I/O with pull ups and Schmitt triggers. The
SYSclock and xInterrupt pads are 2mA outputs.
Auto Increment Disable: This disables the automatic incrementing of the I²C register addresses. It can allow repeated writes
to the same register, useful for adjusting a parameter to optimize its value.
Table 114: Analog Test Mode - 0X47 [71]
Bit Name
State Comment
7 CAP_TRIM
1
Enable the test mode for determination of capacitance trim value
0
6
Pipe ADC1 to Data
Filter
1
0
Enable the ADC1 input channel as a direct input to the data filter
Normal operation
5
Brown-Out Power
Down
1
0
Override the brown-out POR to allow test at any voltage
4
Auto Increment
Disable
1
0
Address increment disabled (IIC only)
1
3
0
1
2 Ignore XTAL Control
0
1
1 Dig Pad Test A
0
Ignore crystal control (digital clock gating)
Enabled:
Input
SSSN
DClock
DSSN
xBurst
Disabled
Enabled:
Corresponding output
Doptional
RXTX
xINT
sysClk
Enabled:
Input
1
Doptional
0 Dig Pad Test B
xBurst
RXTX
Enabled:
Corresponding output
SSSN
xINT
DSSN
0
Disabled
9.2.7. RF Test Modes
This register is used for factory testing of the AMIS-53000 and has no user functions.
9.2.8. Analog Test MUX
This register is used for factory testing of the AMIS-53000 and has no user functions.
AMI Semiconductor – Aug. 05, Rev. 1.0
93
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