TA1317AN Datasheet, PDF (43/59 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Note
No.
Parameter
24 Parabola amplitude EHT
compensation
25 AGC operating current
TA1317AN
SW5
OFF
SW6
B
SW7
ON
Test Condition
SW Mode
SW8 SW10 SW11 SW17 SW24
Test Method
(unless otherwise specified, V_CC = 9 V, Ta = 25 ± 3°C, data = preset values)
OFF B
ON
A
A (1) Input vertical trigger pulse to pin V_IN.
Pulse level (VT) = 3.0 V
(2) Apply external power supply V₃ to pin 3 (EHT IN).
(3) Set EW PARABOLA (sub-address: 0A) to center (data: 20).
(4) Set external power supply V₃ to 7 V and measure Pin 10 (EW FD) amplitude EHT
(7).
(5) Set external power supply V₃ to 1 V and measure Pin 10 (EW FD) amplitude EHT
(1).
(6) Calculate change amount EHT using the following formula.
EHT (7) − EHT (1)
EHT =
× 100
EHT (7)
OFF B
ON OFF B
ON
A
B (1) Input vertical trigger pulse to pin V_IN.
Pulse level (VT) = 3.0 V
(2) When V AGC (sub-address: 09) is switched, set data to 00, 40, 80, and C0 and
measure the following.
(3) Connect external power supply 2 V through 2 kΩ to pin 24 (AGC FILTER).
(4) Monitor pin 24 (AGC FILTER) and measure pulse levels V_X (00), V_X (40), V_X (80),
and V_X (C0) as shown in the figure below.
(5) Calculate output currents (I_X (00), I_X (40), I_X (80), I_X (C0) using the following
formula.
V_X
Pin 24 (AGC FILTER) waveform
V_X (**)
I_X (**) =
2 kΩ
43
2002-09-06