TA1317AN Datasheet, PDF (21/59 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

Characteristics
Vertical S correction (V S correction)
change amount
Vertical integral correction
(V _∫ correction) change amount
Vertical EHT compensation (V EHT
compensation) change amount
EHT input dynamic range
Horizontal amplitude adjustment
(picture width) change amount
Parabola amplitude adjustment
(EW parabola) change amount
EW top corner correction
(EW top corner) change amount
EW bottom corner correction
(EW bottom corner) change amount
EW corner correction change amount
EW S correction change amount
EW trapezium correction change
amount
Horizontal EHT compensation (H-EHT
compensation) DC change amount
Parabola amplitude EHT
compensation
Symbol
V_S (80)
V_S (BF)
V_S
V _∫ (80)
V _∫ (8F)
V_∫
V_E (80)
V_E (87)
V_EHT
V_EHL
V_EHH
V_EV (00)
V_EV (FC)
V_EV
V_PB (00)
V_PB (20)
V_PB (3F)
V_PB
V_TC (00)
V_TC (F8)
V_TCP
V_TCN
V_BC (00)
V_BC (F8)
V_BCP
V_BCN
V_M (00)
V_M (F8)
V_MP
V_MN
V_S (00)
V_S (F8)
V_SP
V_SN
V_ET (00)
V_ET (FE)
V_ETP
V_ETN
V_HC (80)
V_HC (87)
V_HC
EHT (1)
EHT (7)
EHT
Test
Circuit












































21
TA1317AN
Test Condition
Min Typ. Max Unit
1.92 2.26 2.60
V_p-p
(Note 12) _{1.27 1.50 1.73}
17
21
25
%
1.54 1.82 2.10
V_p-p
(Note 13) 1.62 1.90 2.18
3.0 4.0 5.2
%
1.58 1.86 2.14
V_p-p
(Note 14) 1.44 1.69 1.94
8.5 10.0 11.5 %
1.9 2.4 2.9
(Note 15)
V
5.9 6.4 6.9
5.20 6.15 7.10
(Note 16) 1.30 1.55 1.80
V
4.20 4.60 5.00
0.00 0.02 0.06
1.6 2.0 2.3
(Note 17)
V_p-p
2.8 3.3 3.8
2.8 3.3 3.8
2.3 2.8 3.2
V_p-p
0.9 1.2 1.4
(Note 18)
32
40
46
%
−46 −40 −32
2.4 2.8 3.2
V_p-p
0.9 1.2 1.4
(Note 19)
32
45
55
%
−52 −40 −35
2.4 2.8 3.2
V_p-p
0.8 1.1 1.4
(Note 20)
40
47
57
%
−52 −42 −32
2.2 2.6 3.0
V_p-p
1.0 1.4 1.6
(Note 21)
28
35
40
%
−40 −32 −27
2.4 2.7 3.0
ms
−3.0 −2.7 −2.4
(Note 22)
11.0 13.5 16.0
%
−16.0 −13.5 −11.0
3.0 3.6 4.2
(Note 23) 4.0 4.7 5.4
V
1.0 1.2 1.4
1.55 1.90 2.20
V_p-p
(Note 24) 1.65 2.00 2.30
2.7 4.0 5.3
%
2002-09-06