TA1317AN Datasheet, PDF (29/59 Pages) Toshiba Semiconductor – TOSHIBA Bipolar Linear Integrated Circuit Silicon Monolithic

TA1317AN
Note
No.
9
Parameter
SW5
Vertical amplitude adjustment OFF
(picture height) change
amount
SW6
B
SW7
ON
Test Condition
SW Mode
SW8 SW10 SW11 SW17 SW24
Test Method
(unless otherwise specified, V_CC = 9 V, Ta = 25 ± 3°C, data = preset values)
OFF B
ON
A
A (1) Input vertical trigger pulse to pin V_IN.
Pulse level (VT) = 3.0 V
(2) Set VD (sub-address: 00) to AC-Coupling mode (data: 81).
(3) Set V INTEGRAL CORRECTION (sub-address: 08) to center (data: 88).
(4) Set V S CORRECTION (sub-address: 09) to center (data: A0).
(5) Set V SHIFT (sub-address: 01) data to 82.
(6) Set PICTURE HEIGHT (sub-address: 00) to minimum (data: 01) and measure Pin 6
(V NF) amplitude (V_NFL).
(7) Set PICTURE HEIGHT (sub-address: 00) to maximum (data: FF) and measure Pin
6 (V NF) amplitude (V_NFH).
(8) Determine variable ranges (V_NFP, V_NFN) using the following formulas.
Pin 6
(V NF) waveform
V_NFP =
V_NFH − V_NFM
V_NFM
× 100,
V_NFN =
V_NFL − V_NFM
V_NFM
× 100
29
2002-09-06