CD00161566 Datasheet, PDF (78/105 Pages) STMicroelectronics – nullMedium-density performance line ARM-based 32-bit MCU

Electrical characteristics
STM32F103x8, STM32F103xB
Symbol
Table 49. ADC accuracy^{(1) (2) (3)}
Parameter
Test conditions
Typ
Max⁽⁴⁾ Unit
ET Total unadjusted error
EO Offset error
EG Gain error
ED Differential linearity error
EL Integral linearity error
f_PCLK2 = 56 MHz,
f_ADC = 14 MHz, R_AIN < 10 k,
V_DDA = 2.4 V to 3.6 V
Measurements made after
ADC calibration
±2
±1.5
±1.5
±1
±1.5
±5
±2.5
±3
LSB
±2
±3
1. ADC DC accuracy values are measured after internal calibration.
2. Better performance could be achieved in restricted V_DD, frequency and temperature ranges.
3. ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current
affect the ADC accuracy.
within
the
limits
specified
for
I_INJ(PIN)
and
I_INJ(PIN)
in
Section
5.3.12
does
not
4. Based on characterization, not tested in production.
Figure 37. ADC accuracy characteristics
4095
4094
4093
7
6
5
4
3
2
1
[1LSB_IDEAL
=V^REF+
4096
(or
V_{DDA depending}
4096
on
package)]
E_G
(2)
E_T
(3)
(1)
E_O
E_L
E_D
1 LSB_IDEAL
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
E_T=Total Unadjusted Error: maximum deviation
between the actual and the ideal transfer curves.
E_O=Offset Error: deviation between the first actual
transition and the first ideal one.
E_G=Gain Error: deviation between the last ideal
transition and the last actual one.
E_D=Differential Linearity Error: maximum deviation
between actual steps and the ideal one.
E_L=Integral Linearity Error: maximum deviation
between any actual transition and the end point
correlation line.
0
1234567
V_SSA
4093 4094 4095 4096
V_DDA
ai14395b
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DocID13587 Rev 16