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HYB39S256400 Datasheet, PDF (19/56 Pages) Siemens Semiconductor Group – 256 MBit Synchronous DRAM
HYB 39S256400/800/160T
256 MBit Synchronous DRAM
Notes for AC Parameters
1. For proper power-up see the operation section of this data sheet.
2. AC timing tests for LV-TTL versions have VIL = 0.4 V and VIH = 2.4 V with the timing referenced
to the 1.4 V crossover point. The transition time is measured between VIH and VIL. All AC
measurements assume tT = 1 ns with the AC output load circuit shown in Figure 1. Specified tAC
and tOH parameters are measured with a 50 pF only, without any resistive termination and with
an input signal of 1 V/ns edge rate between 0.8 V and 2.0 V.
CLOCK
t CH
2.4 V
0.4 V
t CL
tT
t SETUP
t HOLD
INPUT
1.4 V
tAC
t LZ
tAC
t OH
OUTPUT
1.4 V
t HZ
SPT03404
Figure 1
3. AC timing test conditions for SSTL_3 versions
+Vtt
I/O
50 pF
Measurement conditions for
tAC and tOH
Output
Z = 50 Ω
Figure 2
Termination voltage
Reverence Level of Output Signals (VREF)
Output Load
Transition Time (Rise and Fall) of Input Signals
Reference Level of Input Signals (VREF)
50 Ω
30 pF
SPS03410
0.45 × VCCQ
0.45 × VCCQ
see Figure 2
1 ns
0.45 × VCCQ
Semiconductor Group
19
1998-10-01