RX230 Datasheet, PDF (144/177 Pages) Renesas Technology Corp – 54-MHz 32-bit RX MCUs, built-in FPU, 88.56 DMIPS, up to 512-KB flash memory

RX230 Group, RX231 Group
5. Electrical Characteristics
Table 5.47 A/D Conversion Characteristics (3)
Conditions: 2.7V ≤ VCC = VCC_USB = AVCC0 ≤ 5.5V, 2.7V ≤ VREFH0 ≤ AVCC0, reference voltage = VREFH0 selected,
VSS = AVSS0 = VREFL0 = VSS_USB = 0V, Ta = –40 to +105°C
Item
Min.
Frequency
1
Resolution
—
Conversion time*¹
(Operation at
PCLKD = 27 MHz)
Permissible signal
2
source impedance
(Max.) = 1.1 kΩ
3
Analog input capacitance Cs
—
Analog input resistance
Rs
—
Offset error
—
Full-scale error
—
Quantization error
—
Absolute accuracy
—
DNL differential non-linearity error
—
INL integral non-linearity error
—
Typ.
Max.
—
27
—
12
—
—
—
—
—
15
—
2.5
±0.5
±4.5
±0.75
±4.5
±0.5
—
±1.25
±5.0
±8.0
±1.0
—
±1.0
±3.0
Unit
MHz
Bit
μs
pF
kΩ
LSB
LSB
LSB
LSB
LSB
LSB
LSB
Test Conditions
High-precision channel
The ADCSR.ADHSC bit is 1
The ADSSTRn.SST[7:0] bits are
0Dh
Normal-precision channel
The ADCSR.ADHSC bit is 1
The ADSSTRn.SST[7:0] bits are
28h
Pin capacitance included
Figure 5.67
Figure 5.67
High-precision channel
Other than above
Note: The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential non-linearity error, and INL integral non-linearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
R01DS0261EJ0110 Rev.1.10
Oct 30, 2015
Page 144 of 177