RX230 Datasheet, PDF (143/177 Pages) Renesas Technology Corp – 54-MHz 32-bit RX MCUs, built-in FPU, 88.56 DMIPS, up to 512-KB flash memory

RX230 Group, RX231 Group
5. Electrical Characteristics
Table 5.46 A/D Conversion Characteristics (2)
Conditions: 2.4 V ≤ VCC = VCC_USB = AVCC0 ≤ 5.5 V, 2.4 V ≤ VREFH0 ≤ AVCC0, reference voltage = VREFH0 selected,
VSS = AVSS0 = VREFL0 = VSS_USB = 0 V, T_a = –40 to +105°C
Item
Min.
Typ.
Max.
Unit
Test Conditions
Frequency
1
—
32
MHz
Resolution
—
—
12
Bit
Conversion time*¹
(Operation at
PCLKD = 32 MHz)
Permissible signal 1.41
—
—
μs
High-precision channel
source impedance
(Max.) = 1.3 kΩ
The ADCSR.ADHSC bit is 0
The ADSSTRn register is 0Dh
2.25
—
—
Normal-precision channel
The ADCSR.ADHSC bit is 0
The ADSSTRn register is 28h
Analog input capacitance Cs
—
—
15
pF Pin capacitance included
Figure 5.67
Analog input resistance
Rs
—
—
2.5
kΩ Figure 5.67
Offset error
—
±0.5
±4.5
LSB
Full-scale error
—
±0.75
±4.5
LSB
Quantization error
—
±0.5
—
LSB
Absolute accuracy
—
±1.25
±5.0
LSB High-precision channel
±8.0
LSB Other than above
DNL differential non-linearity error
—
±1.0
—
LSB
INL integral non-linearity error
—
±1.0
±4.5
LSB
Note: The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential non-linearity error, and INL integral non-linearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
R01DS0261EJ0110 Rev.1.10
Oct 30, 2015
Page 143 of 177