MB81F643242C Datasheet, PDF (45/56 Pages) Fujitsu Component Limited. – 4 X 512 K X 32 BIT SYNCHRONOUS DYNAMIC RAM

MB81F643242C-60/-70/-10 Advanced Info (AE0.1E)
s SCITT TEST MODE
ABOUT SCITT
SCITT (Static Component Interconnection Test Technology) is an XNOR circuit based test technology that is used
for testing interconnection between SDRAM and SDRAM controller on the printed circuit boards. SCITT provides
inexpensive board level test mode in combination with boundary-scan. The basic idea is simple, consider all output
of SDRAM as output of XNOR circuit and each output pin has a unique mapping on the input of SDRAM. The ideal
schematic block diagram is as shown below.
Boundary
Scan
µC
ASIC
TEST
Control
xAddress
Bus
XNOR
SDRAM
CORE
Data Bus
TEST Control : CAS, CS, CKE
xAddress Bus : A0 to A10, BA0, BA1, RAS, DQM0 to DQM3, CLK, WE
Data Bus
: DQ0 to DQ31
It is static and provides easy test pattern that result in a high diagnostic resolution for detecting all open/short faults.
The MB81F643242C adopts SCITT as an optional function. See Package and “Ordering Information” in section “s
PACKAGE“.
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