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PXD10 Datasheet, PDF (94/130 Pages) Lumins Inc. – 4” Dia.X 6” extruded aluminum step poles
Electrical characteristics
Table 46. Flash module life
Symbol C
Parameter
Conditions
Value
Unit
Min
Typ
P/E CC C Number of program/erase cycles per
—
block for 16 KB blocks over the operating
temperature range (TJ)
P/E CC C Number of program/erase cycles per
—
block for 32 KB blocks over the operating
temperature range (TJ)
P/E CC C Number of program/erase cycles per
—
block for 128 KB blocks over the
operating temperature range (TJ)
Retention CC C Minimum data retention at 85 °C
average ambient temperature1
Blocks with 0–1,000 P/E
cycles
100000
— cycles
10000 100000 cycles
1000 100000 cycles
20
— years
Blocks with 10,000 P/E
10
cycles
— years
Blocks with 100,000 P/E
5
cycles
— years
NOTES:
1 Ambient temperature averaged over duration of application, not to exceed recommended product operating
temperature range.
Table 47. Flash memory read access timing
Symbol C
Parameter
Condition1
fREAD
CC P Maximum frequency for flash memory reading
C
2 wait states
1 wait state
C
0 wait states
NOTES:
1 VDD = 3.3 V ±10% / 5.0 V ±10%, TA = –40 to 105 C, unless otherwise specified
Max value Unit
64
MHz
40
20
3.17 ADC electrical characteristics
The device provides a 10-bit Successive Approximation Register (SAR) Analog to Digital Converter.
PXD10 Microcontroller Data Sheet, Rev. 1
94
Freescale Semiconductor