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MA31750 Datasheet, PDF (41/42 Pages) Dynex Semiconductor – High Performance MIL-STD-1750 Microprocessor
12. RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to total dose radiation levels, each
wafer lot will be approved when all sample devices pass the
total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with MIL STD 883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
3x105 Rad(Si)
Transient Upset (Stored data loss)
5x1010 Rad(Si)/sec
Transient Upset (Survivability)
>1x1012 Rad(Si)/sec
Neutron Hardness (Function to specification) >1x1015 n/cm2
Single Event Upset**
1x10-11 Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Figure 42: Radiation Hardness Parameters
13. RELATED DOCUMENTATION
A number of Applications Notes are available to support
the information in this data sheets. Please call for details:
Application Note
Describes
No. 2
No. 3
No. 4
No. 8
No. 11
No. 14
No. 15
1750B Mode
Use of Console Mode
Use of Interrupts
Use of VIO Instructions
Bus Arbitration
Use of NMA31750 Samples
Pipelining Instructions
MA31750
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