CDC960 Datasheet, PDF (22/38 Pages) Texas Instruments – 200-MHz CLOCK SYNTHESIZER/DRIVER WITH SPREAD SPECTURM CAPABILITY AND DEVICE CONTROL INTERFACE

CDC960
200ĆMHz CLOCK SYNTHESIZER/DRIVER
WITH SPREAD SPECTRUM CAPABILITY AND DEVICE CONTROL INTERFACE
SCAS675 – APRIL 2002
switching characteristics, V_DD = 3.135 V to 3.465 V, T_A = 0°C to 70°C
CPU, C_L = 10 pF, R_L = Test Load
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST CONDITIONS
MIN TYP^† MAX Unit
tpd1
Propagation delay time
tpd2
Propagation delay time
XIN
SCLK ↑
CPUx
CPUx
tc
CPU clock period^†
tjit(cc)
odc
tjit(acc)
tsk(b)
Cycle to cycle jitter
Synthesizer mode
Duty cycle
Accumulated jitter, SSC = ON, see Note 8
CPU bank skew ↑ edges
CPUx
CPUx
f(XIN) ≥ 1 MHz, TEST MODE
Test mode
f(CPU) = 100 MHz
f(CPU) = 133 MHz
f(CPU) = 166 MHz
f(CPU) = 200 MHz
f(CPU) = 100 to 200 MHz
f(CPU) = 100 to 200 MHz
f(CPU) = 100 to 200 MHz
f(CPU) = 100 to 200 MHz
3.5
10.0
7.5
6.0
5.0
47
–150
15 ns
18
ns
10.1
7.60
ns
6.08
5.1
160 ps
53 %
150 ps
70 ps
tsk(ow)
CPU x-point to ↑ edges
Output skew window
time independent (3.3 V)
CPU x-point to ↑ edges
Output skew window
time variant skew
↑ CPU ^CPUx
200 MHz _CPUx
↑ CPU ^CPUx
200 MHz _CPUx
PCIx
LDTx
PCIx
LDTx
f(PCI) = 33.3 MHz
f(LDT) = 66.7 MHz
f(PCI) = 33.3 MHz
f(LDT) = 66.7 MHz
500
500
ps
200
200
tr
Rise time
tf
Fall time
Test load at the ac coupling Vref = 0V "400 mV
node including CPU load. differential measured
100
300 ps
2.5
8.0 V/ns
100
300 ps
2.5
8.0 V/ns
vr
Edge rate rising edge
(maintained during total
transition)
Test load at the ac coupling Vref = 0V "400 mV
node including CPU load. differential measured
2.0
8.0 V/ns
vf
Edge rate falling edge
(maintained during total
transition)
Test load at ac coupling
node
2.0
8.0 V/ns
† _{All typical values are measured at their nominal VDD values.}
NOTE 8: Accumulated jitter is the sum of individual consecutive cycle-to-cycle jitter reads added for a at least 32 µs (one SSC modulation period).
The limit corresponds to the w/c cumulative shortest and longest jitter number found during evaluation time.
22
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