SI5344H-42H Datasheet, PDF (21/56 Pages) Silicon Laboratories – HIGH-FREQUENCY,

Si5344H/42H
Table 14. Absolute Maximum Ratings^1,2,3,4
Parameter
DC Supply Voltage
Input Voltage Range
Latch-up Tolerance
ESD Tolerance
Storage Temperature Range
Maximum Junction Temperature During
Operation
Soldering Temperature
(Pb-free profile)⁴
Soldering Temperature
(Pb-free profile)⁴
Time
at
T_PEAK
Symbol
V_DD
V_DDA
V_DDO
V_DDS
V_I1
V_I2
V_I3
LU
HBM
T_STG
T_JCT
T_PEAK
T_P
Test Condition
IN0, IN1
IN_SEL, RST, OE,
I2C_SEL, SDI, SCLK, A0/
CS, A1,
SDA/SDIO
XA/XB
100 pF, 1.5 k
Value
Unit
–0.5 to 3.8
V
–0.5 to 3.8
V
–0.5 to 3.8
V
–0.5 to 3.8
V
–0.85 to 3.8
V
–0.5 to 3.8
V
–0.5 to 2.7
V
JESD78 Compliant
2.0
kV
–55 to 150
°C
–55 to 125
°C
260
°C
20–40
s
Notes:
1. Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be
restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
2. 64-QFN and 44-QFN packages are RoHS-6 compliant.
3. For more packaging information, including MSL rating, go to www.silabs.com/support/quality/pages/
RoHSInformation.aspx.
4. The device is compliant with JEDEC J-STD-020.
Rev. 1.0
21