RX113_16 Datasheet, PDF (105/131 Pages) Renesas Technology Corp – 32 MHz, 32-bit RX MCUs, 50 DMIPS, up to 512 Kbytes of flash memory

RX113 Group
5. Electrical Characteristics
5.6 D/A Conversion Characteristics
Table 5.43 D/A Conversion Characteristics (1)
Conditions: 1.8 V ≤ VCC = VCC_USB ≤ 3.6 V, 1.8 V ≤ AVCC0 ≤ 3.6 V, 1.8 V ≤ VREFH ≤ AVCC0, VSS = AVSS0 = VREFL =
VSS_USB = 0 V, T_a = –40 to +105°C
Reference voltage = VREFH and VREFL selected
Item
Min.
Typ.
Max.
Unit
Test Conditions
Resolution
Resistive load
—
—
12
Bit
30
—
—
kΩ
Capacitive load
Output voltage range*¹
—
—
50
pF
0.35
—
VREFH
V
VREFH ≤
AVCC0 - 0.47 V
0.35
—
AVCC0 - 0.47
V
VREFH >
AVCC0 - 0.47 V
DNL differential nonlinearity error
—
±0.5
±1.0
LSB
INL integral nonlinearity error
—
±2.0
±8.0
LSB
Offset error
—
—
±20
mV
Full-scale error
Output resistance
Conversion time
—
—
±20
mV
—
75
—
Ω
—
—
30
μs
Note 1. There are restrictions on AVCC0 and VCC depending on the usage conditions for the 12-bit D/A converter and I/O ports.
When using ports J0 and J2 as DA0 and DA1 output, make sure that VCC ≥ D/A output voltage.
Table 5.44 D/A Conversion Characteristics (2)
Conditions: 1.8 V ≤ VCC = VCC_USB ≤ 3.6 V, 1.8 V ≤ AVCC0 = VREFH ≤ 3.6 V, VSS = AVSS0 = VREFL = VSS_USB = 0 V,
T_a = –40 to +105°C
Reference voltage = AVCC0 and AVSS0 selected
Item
Min.
Resolution
—
Resistive load
30
Capacitive load
—
Output voltage range*¹
0.35
DNL differential nonlinearity error
—
INL integral nonlinearity error
—
Offset error
—
Full-scale error
—
Output resistance
—
Conversion time
—
Typ.
Max.
Unit
—
12
Bit
—
—
kΩ
—
50
pF
—
AVCC0 - 0.47
V
±0.5
±2.0
LSB
±2.0
±8.0
LSB
—
±30
mV
—
±30
mV
75
—
Ω
—
30
μs
Test Conditions
Note 1. There are restrictions on AVCC0 and VCC depending on the usage conditions for the 12-bit D/A converter and I/O ports.
When using ports J0 and J2 as DA0 and DA1 output, make sure that VCC ≥ D/A output voltage.
R01DS0216EJ0110 Rev.1.10
Mar 31, 2016
Page 105 of 131