MT40A512M16HA-083EIT Datasheet, PDF (291/373 Pages) Micron Technology – Programmable data strobe preambles

8Gb: x4, x8, x16 DDR4 SDRAM
Electrical Characteristics – AC and DC Output Measurement
Levels
Table 113: Single-Ended Output Levels (Continued)
Parameter
AC output low measurement level (for output slew rate)
Symbol
V_OL(AC)
DDR4-1600 to DDR4-3200 Unit
(0.7 - 0.15) × V_DDQ
V
Note: 1. The swing of ±0.15 × V_DDQ is based on approximately 50% of the static single-ended
output peak-to-peak swing with a driver impedance of RZQ/7 and an effective test load
of 50Ω to V_TT = V_DDQ.
Using the same reference load used for timing measurements, output slew rate for fall-
ing and rising edges is defined and measured between V_OL(AC) and V_OH(AC) for single-
ended signals.
Table 114: Single-Ended Output Slew Rate Definition
Description
Single-ended output slew rate for rising edge
Single-ended output slew rate for falling edge
Measured
From
To
V_OL(AC)
V_OH(AC)
V_OH(AC)
V_OL(AC)
Figure 230: Single-ended Output Slew Rate Definition
TR_se
Defined by
[V_OH(AC) - V_OL(AC)ΔTR_se
[V_OH(AC) - V_OL(AC)ΔTF_se
V_OH(AC)
TF_se
V_OL(AC)
09005aef861d1d4a
8gb_ddr4_dram.pdf - Rev. G 1/17 EN
291
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