MT40A512M16HA-083EIT Datasheet, PDF (271/373 Pages) Micron Technology – Programmable data strobe preambles

8Gb: x4, x8, x16 DDR4 SDRAM
Electrical Characteristics – AC and DC Single-Ended Input
Measurement Levels
Table 90: Derating Values for ^tIS/^tIH – AC90/DC65-Based
Δ^tIS with AC90 Threshold, Δ^tIH with DC65 Threshold Derating (ps) – AC/DC-Based
CMD/
ADDR
Slew Rate
V/ns
10.0 V/ns
Δ^tIS Δ^tIH
8.0 V/ns
Δ^tIS Δ^tIH
CK, CK# Differential Slew Rate
6.0 V/ns 4.0 V/ns 3.0 V/ns 2.0 V/ns
Δ^tIS Δ^tIH Δ^tIS Δ^tIH Δ^tIS Δ^tIH Δ^tIH Δ^tIH
1.5 V/ns
Δ^tIS Δ^tIH
1.0 V/ns
Δ^tIS Δ^tIH
7.0
68 47 69 47 70 48 72 50 73 52 77 56 85 63 100 78
6.0
66 45 67 46 68 47 69 49 71 50 75 54 83 62 98 77
5.0
63 43 64 44 65 45 66 46 68 48 72 52 80 60 95 75
4.0
59 40 59 40 60 41 62 43 64 45 68 49 75 56 90 71
3.0
51 34 52 35 53 36 54 38 56 40 60 43 68 51 83 66
2.0
36 24 37 24 38 25 39 27 41 29 45 33 53 40 68 55
1.5
21 13 22 13 23 14 24 16 26 18 30 22 38 29 53 44
1.0
–9 –9 –8 –8 –8 –8 –6 –6 –4 –4 0
0
8
8 23 23
0.9
–15 –13 –15 –12 –14 –11 –12 –9 –10 –7 –6 –4 1
4 16 19
0.8
–23 –17 –23 –17 –22 –16 –20 –14 –18 –12 –14 –8 –7 –1 8 14
0.7
–34 –23 –33 –22 –32 –21 –30 –20 –28 –18 –25 –14 –17 –6 –2 9
0.6
–47 –31 –47 –30 –46 –29 –44 –27 –42 –25 –38 –22 –31 –14 –16 1
0.5
–67 –42 –66 –41 –65 –40 –63 –38 –61 –36 –58 –33 –50 –25 –35 –10
0.4
–95 –58 –95 –57 –94 –56 –92 –54 –90 –53 –86 –49 –79 –41 –64 –26
Data Receiver Input Requirements
The following parameters apply to the data receiver Rx MASK operation detailed in the
Write Timing section, Data Strobe-to-Data Relationship.
The rising edge slew rates are defined by srr1 and srr2. The slew rate measurement
points for a rising edge are shown in the figure below. A LOW-to-HIGH transition time,
tr1, is measured from 0.5 × V_diVW,max below V_{CENTDQ,midpoint} to the last transition
through 0.5 × V_diVW,max above V_{CENTDQ,midpoint}; tr2 is measured from the last transition
through 0.5 × V_diVW,max above V_{CENTDQ,midpoint} to the first transition through the 0.5 ×
V_IHL(AC)min above V_{CENTDQ,midpoint}.
The falling edge slew rates are defined by srf1 and srf2. The slew rate measurement
points for a falling edge are shown in the figure below. A HIGH-to-LOW transition time,
tf1, is measured from 0.5 × V_diVW,max above V_{CENTDQ,midpoint} to the last transition
through 0.5 × V_diVW,max below V_{CENTDQ,midpoint}; tf2 is measured from the last transition
through 0.5 × V_diVW,max below V_{CENTDQ,midpoint} to the first transition through the 0.5 ×
V_IHL(AC)min below V_{CENTDQ,midpoint}.
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8gb_ddr4_dram.pdf - Rev. G 1/17 EN
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