MT40A512M16HA-083EIT Datasheet, PDF (130/373 Pages) Micron Technology – Programmable data strobe preambles

8Gb: x4, x8, x16 DDR4 SDRAM
Connectivity Test Mode
Figure 73: Connectivity Test Mode Entry
CK_t
CK_c
Ta
Tb
Tc
Td
Valid input
CKE
RESET_n
TEN
CS_n
CT Inputs
T = 10ns
T = 200μs
t_CKSRX
t_IS
t_{CT_IS}
t_{CT_IS}
T = 500μs
t_{CTCKE_Valid}
t_{CT_IS}
Valid input
t_{CT_Enable}
t_{CTCKE_Valid>10ns}
t_{CT_IS >0ns}
t_{CT_IS}
Valid input
t_{CT_Valid}
t_{CT_Valid}
CT Outputs
Valid
Valid input
Valid input
Valid input
t_{CT_Valid}
Valid
Don’t Care
09005aef861d1d4a
8gb_ddr4_dram.pdf - Rev. G 1/17 EN
130
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