TC1796 Datasheet, PDF (94/134 Pages) Infineon Technologies AG – 32-Bit Single-Chip Microcontroller TriCore

TC1796
Electrical Parameters
Table 15 ADC Characteristics (cont’d) (Operating Conditions apply)
Parameter
Symbol
Min.
Values
Typ. Max.
Unit Note /
Test Condition
Resistance of the R_AREF
–
1
reference voltage
CC
input path¹⁶⁾
Total capacitance C_AINTOT
–
–
of the analog
CC
inputs¹⁶⁾
Switched
C_AINSW
–
–
capacitance at the
CC
analog voltage
inputs
ON resistance of R_AIN CC –
1
the transmission
gates in the
analog voltage
path
1.5
kΩ 500 Ohm
increased for
AN[1:0] used as
reference input⁹⁾
25
pF ⁶⁾⁹⁾
7
pF ⁹⁾¹⁹⁾
1.5
kΩ ⁹⁾
ON resistance for R_AIN7T CC 200 300
the ADC test (pull-
down for AIN7)
1000 Ω
Test feature
available only for
AIN7⁹⁾
Current through
resistance for the
ADC test (pull-
down for AIN7)
I_AIN7T
CC –
15 rms 30 peak mA
Test feature
available only for
AIN7⁹⁾
1) Voltage overshoot to 4 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
summary of the pulses does not exceed 1 h.
2) Voltage overshoot to 1.7 V are permissible, provided the pulse duration is less than 100 µs and the cumulated
summary of the pulses does not exceed 1 h.
3) A running conversion may become inexact in case of violating the normal operating conditions (voltage
overshoot).
4) If the reference voltage V_AREF increases or the V_DDM decreases, so that
V_AREF = (V_DDM + 0.05V to V_DDM + 0.07V), then the accuracy of the ADC decreases by 4LSB12.
5) If a reduced reference voltage in a range of V_DDM/2 to V_DDM is used, then the ADC converter errors increase.
If the reference voltage is reduced with the factor k (k<1), then TUE, DNL, INL Gain and Offset errors increase
with the factor 1/k.
If a reduced reference voltage in a range of 1 V to V_DDM/2 is used, then there are additional decrease in the
ADC speed and accuracy.
6) Current peaks of up to 6 mA with a duration of max. 2 ns may occur
7) TUE is tested at V_AREF = 3.3 V, V_AGND = 0 V and V_DDM = 3.3 V
Data Sheet
94
V1.0, 2008-04