MC9S08DZ60 Datasheet, PDF (164/396 Pages) Freescale Semiconductor, Inc – Microcontrollers

9.3.0.1 ACMPx Status and Control Register (ACMPxSC)
ACMPxSC contains the status flag and control bits which are used to enable and configure the ACMP.
R
W
Reset:
7
ACME
0
6
ACBGS
5
ACF
4
ACIE
3
ACO
2
ACOPE
0
0
0
0
0
= Unimplemented
Figure 9-3. ACMPx Status and Control Register
1
0
ACMOD
0
0
.
Table 9-2. ACMPx Status and Control Register Field Descriptions
Field
7
ACME
6
ACBGS
5
ACF
4
ACIE
3
ACO
2
ACOPE
1:0
ACMOD
Description
Analog Comparator Module Enable — ACME enables the ACMP module.
0 ACMP not enabled
1 ACMP is enabled
Analog Comparator Bandgap Select — ACBGS is used to select between the bandgap reference voltage or
the ACMPx+ pin as the input to the non-inverting input of the analog comparator.
0 External pin ACMPx+ selected as non-inverting input to comparator
1 Internal reference select as non-inverting input to comparator
Analog Comparator Flag — ACF is set when a compare event occurs. Compare events are defined by ACMOD.
ACF is cleared by writing a one to ACF.
0 Compare event has not occured
1 Compare event has occured
Analog Comparator Interrupt Enable — ACIE enables the interrupt from the ACMP. When ACIE is set, an
interupt will be asserted when ACF is set.
0 Interrupt disabled
1 Interrupt enabled
Analog Comparator Output — Reading ACO will return the current value of the analog comparator output. ACO
is reset to a 0 and will read as a 0 when the ACMP is disabled (ACME = 0).
Analog Comparator Output Pin Enable — ACOPE is used to enable the comparator output to be placed onto
the external pin, ACMPxO.
0 Analog comparator output not available on ACMPxO
1 Analog comparator output is driven out on ACMPxO
Analog Comparator Mode — ACMOD selects the type of compare event which sets ACF.
00 Encoding 0 — Comparator output falling edge
01 Encoding 1 — Comparator output rising edge
10 Encoding 2 — Comparator output falling edge
11 Encoding 3 — Comparator output rising or falling edge
MC9S08DZ60 Series Data Sheet, Rev. 1 Draft E
164
PRELIMINARY
Freescale Semiconductor
Subject to Change