GC4116 Datasheet, PDF (49/57 Pages) List of Unclassifed Manufacturers – MULTI-STANDARD QUAD DUC CHIP

GC4116 MULTI-STANDARD QUAD DUC CHIP
DATA SHEET REV 1.0
6.4 POWER CONSUMPTION
The power consumption is a function of the operating mode of the chip. The following equation estimates the typical power
supply current for the chip. Chip to chip variation is typically +/- 5%. The AC specification in Table 16 is the current tested for
during production test and represents the absolute maximum power supply current.
I PAD
(TYP)
=
(
V
PAD
)


F_---4--C_--K_
(
N
o
u
t
)
(
C
o
u
t
)
ICORE (TYP)
=


V_---2--C_-.-O_-5-R_--E_{-}


1---^F0---0-^C---KM^{---}
20 + A_30 + ^4---N5---0--_ + 15R
mA
Where A is the number of active channels (0 to 4), N is the CIC decimation ratio, F_CKis the clock rate, Nout is the number of
active output data pins, and Cout is the average capacitive load on each data pin. R is one if the resampler is active, and is 0 if
the resampler is off (RES_RESET=1 in address 5). The equation assumes random data transition density of 1 rising edge per
four clock cycles.
6.5
DC CHARACTERISTICS
Table 15: DC Operating Conditions (-40 to 85°C case unless noted)
PARAMETER
SYMBOL
V_PAD = 3.0 to 3.6V
MIN
MAX
Voltage input low
Voltage input high
Voltage output low (I_OL = 2mA)
Voltage output high (I_OH = -2mA)
Leakage current (V_IN = 0V or V_PAD)
Inputs or Outputs in tristate condition
V_IL
0.8
V_IH
2.3
V_OL
0.5
V_OH
2.4
| I_IN |
1
Pullup current (V_IN = 0V) (TDI, TMS, TCK)
| I_PU |
5
35
Quiescent supply current, I_CORE or I_PAD
I_CCQ
2
(V_IN=0 or V_IN=V_PAD, Address 0 = F0, LVDS=0)
Data input capacitance (All inputs except CK)
C_IN
4 (typical)
Clock input capacitance (CK input)
C_CK
13 (typical)
Notes:
Currents are measured at nominal voltages, high temperature (85C).
Voltages are measured at low speed. Output voltages are measured with the indicated current load
Test Levels:
I. Controlled by design and process and not directly tested or recommended practice.
II. Verified on initial part evaluation.
III. 100% tested at room temperature, sample tested at hot and cold.
IV. 100% tested at hot, sample tested cold.
V. 100% tested at hot and cold.
UNITS
V
V
V
V
uA
uA
mA
pF
pF
TEST
LEVEL
IV
IV
IV
IV
IV
IV
IV
I
I
© 1999−2001 GRAYCHIP,INC.
- 44 -
APRIL 27, 2001
This document contains preliminary information which may be changed at any time without notice