MSP430F677X1_16 Datasheet, PDF (85/162 Pages) Texas Instruments – Polyphase Metering SoCs

MSP430F677x1, MSP430F676x1, MSP430F674x1
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SD24_B Performance (continued)
f_SD24 = 1 MHz, SD24OSRx = 256, SD24REFON = 1
PARAMETER
TEST CONDITIONS
SD24GAIN: 1, with external reference (1.2 V)
E_G
Gain error⁽¹⁾
SD24GAIN: 8, with external reference (1.2 V)
SD24GAIN: 32, with external reference (1.2 V)
ΔE_G/ΔT
Gain error temperature
coefficient⁽²⁾, internal
reference
SD24GAIN: 1, 8, or 32 (with internal reference)
ΔE_G/ΔT
Gain error temperature
coefficient⁽²⁾, external
reference
SD24GAIN: 1 (with external reference)
SD24GAIN: 8 (with external reference)
SD24GAIN: 32 (with external reference)
ΔE_G/ΔV_CC Gain error vs V_CC ⁽³⁾
SD24GAIN: 1
SD24GAIN: 8
SD24GAIN: 32
SD24GAIN: 1 (with Vdiff = 0V)
E_OS[V]
Offset error⁽⁴⁾
SD24GAIN: 8
SD24GAIN: 32
E_OS[FS]
Offset error⁽⁴⁾
SD24GAIN: 1 (with Vdiff = 0V)
SD24GAIN: 8
SD24GAIN: 32
ΔE_OS/ΔT
Offset error temperature
coefficient ⁽⁵⁾
SD24GAIN: 1
SD24GAIN: 8
SD24GAIN: 32
SD24GAIN: 1
ΔE_OS/ΔV_CC Offset error vs V_CC ⁽⁶⁾
SD24GAIN: 8
SD24GAIN: 32
CMRR,DC
Common mode rejection at
DC ⁽⁷⁾
SD24GAIN: 1
SD24GAIN: 8
SD24GAIN: 32
SLAS815C – NOVEMBER 2012 – REVISED DECEMBER 2013
MIN TYP MAX UNIT
3V
-1
+1
3V
-2
+2
%
3V
-2
+2
3V
80 ppm/°C
3V
15
3V
15 ppm/°C
3V
15
3V
0.1
3V
0.1
%/V
3V
0.4
3V
2.3
3V
1
mV
3V
0.5
3V
-0.2
+0.2 % FS
3V
-0.7
+0.7 % FS
3V
-1.4
+1.4 % FS
3V
2
3V
0.25
µV/°C
3V
0.1
3V
500
3V
125
µV/V
3V
50
3V
-120
3V
-110
dB
3V
-100
(1) The gain error E_G specifies the deviation of the actual gain G_act from the nominal gain G_nom: E_G = (G_act - G_nom)/G_nom. It covers process,
temperature and supply voltage variations.
(2) The gain error temperature coefficient ΔE_G/ ΔT specifies the variation of the gain error E_G over temperature (E_G(T) = (G_act(T) -
G_nom)/G_nom) using the box method (that is, minimum and maximum values):
ΔE_G/ ΔT = (MAX(E_G(T)) - MIN(E_G(T) ) / (MAX(T) - MIN(T)) = (MAX(G_act(T)) - MIN(G_act(T)) / G_nom / (MAX(T) - MIN(T))
with T ranging from -40°C to +85°C.
(3) The gain error vs V_CC coefficient ΔE_G/ ΔV_CC specifies the variation of the gain error E_G over supply voltage (E_G(V_CC) = (G_act(V_CC) -
G_nom)/G_nom) using the box method (that is, minimum and maximum values):
ΔE_G/ ΔV_CC = (MAX(E_G(V_CC)) - MIN(E_G(V_CC) ) / (MAX(V_CC) - MIN(V_CC)) = (MAX(G_act(V_CC)) - MIN(G_act(V_CC)) / G_nom / (MAX(V_CC) -
MIN(V_CC))
with V_CC ranging from 2.4V to 3.6V.
(4) The offset error E_OS is measured with shorted inputs in 2s complement mode with +100% FS = V_REF/G and -100% FS = -V_REF/G.
Conversion between E_OS [FS] and E_OS [V] is as follows: E_OS [FS] = E_OS [V]×G/V_REF; E_OS [V] = E_OS [FS]×V_REF/G.
(5) The offset error temperature coefficient ΔE_OS/ ΔT specifies the variation of the offset error E_OS over temperature using the box method
(that is, minimum and maximum values):
ΔE_OS/ ΔT = (MAX(E_OS(T)) - MIN(E_OS(T) ) / (MAX(T) - MIN(T))
with T ranging from -40°C to +85°C.
(6) The offset error vs V_CC ΔE_OS/ ΔV_CC specifies the variation of the offset error E_OS over supply voltage using the box method (that is,
minimum and maximum values):
ΔE_OS/ ΔV_CC = (MAX(E_OS(V_CC)) - MIN(E_OS(V_CC) ) / (MAX(V_CC) - MIN(V_CC))
with V_CC ranging from 2.4V to 3.6V.
(7) The DC CMRR specifies the change in the measured differential input voltage value when the common mode voltage varies:
DC CMRR = -20log(Δ_MAX/FSR) with Δ_MAX being the difference between the minium value and the maximum value measured when
sweeping the common mode voltage.
The DC CMRR is measured with both inputs connected to the common mode voltage (that is, no differential input signal is applied), and
the common mode voltage is swept from -1V to V_CC.
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