SM470R1B1M-HT Datasheet, PDF (62/67 Pages) Texas Instruments – 16/32-BIT RISC FLASH MICROCONTROLLER

SM470R1B1M-HT
SPNS155F – SEPTEMBER 2009 – REVISED AUGUST 2012
External
MibADC
R_s
Input Pin
R_i
V_src
Sample Switch
Parasitic
Capacitance
Sample
Capacitor
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R _leak
C_i
Figure 24. MibADC Input Equivalent Circuit
Table 15. Multi-Buffer ADC Timing Requirements⁽¹⁾
t_c(ADCLK)
t_d(SH)
t_d©)
t_d(SHC) ⁽²⁾
Cycle time, MibADC clock
Delay time, sample and hold time
Delay time, conversion time
Delay time, total sample/hold and conversion time
MIN
0.067
1
0.55
1.55
NOM
MAX UNIT
µs
µs
µs
µs
(1) Not production tested.
(2) This is the minimum sample/hold and conversion time that can be achieved. These parameters are dependent on many factors; for
more details, see the TMS470R1x Multi-Buffered Analog-to-Digital Converter (MibADC) Reference Guide (literature number SPNU206).
The differential nonlinearity error shown in Figure 25 (sometimes referred to as differential linearity) is the
difference between an actual step width and the ideal value of 1 LSB.
0 ... 110
0 ... 101
0 ... 100
0 ... 011
0 ... 010
1 LSB
Differential Linearity
Error(1/2 LSB)
0 ... 001
1 LSB
Differential Linearity
Error(- 1/2 LSB)
0 ... 000
0
1
2
3
4
5
Analog Input Value (LSB)
A. 1 LSB = (AD_REFHI - AD_REFLO)/2¹⁰
Figure 25. Differential Nonlinearity (DNL)
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