SM470R1B1M-HT Datasheet, PDF (1/67 Pages) Texas Instruments – 16/32-BIT RISC FLASH MICROCONTROLLER

SM470R1B1M-HT
www.ti.com
SPNS155F – SEPTEMBER 2009 – REVISED AUGUST 2012
16/32-BIT RISC FLASH MICROCONTROLLER
FEATURES
1
•2 High-Performance Static CMOS Technology
• SM470R1x 16/32-Bit RISC Core ( ARM7TDMI™)
– 60-MHz System Clock (Pipeline Mode)
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party Support
– Built-In Debug Module
• Integrated Memory
– 1M-Byte Program Flash
– Two Banks With 16 Contiguous Sectors
– 64K-Byte Static RAM (SRAM)
– Memory Security Module (MSM)
– JTAG Security Module
• Operating Features
– Low-Power Modes: STANDBY and HALT
– Industrial Temperature Range
• 470+ System Module
– 32-Bit Address Space Decoding
– Bus Supervision for Memory/Peripherals
– Digital Watchdog (DWD) Timer
– Analog Watchdog (AWD) Timer
– Enhanced Real-Time Interrupt (RTI)
– Interrupt Expansion Module (IEM)
– System Integrity and Failure Detection
– ICE Breaker
• Direct Memory Access (DMA) Controller
– 32 Control Packets and 16 Channels
• Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
– Multiply-by-4 or -8 Internal ZPLL Option
– ZPLL Bypass Mode
• Twelve Communication Interfaces:
– Two Serial Peripheral Interfaces (SPIs)
– 255 Programmable Baud Rates
– Three Serial Communication Interfaces
(SCIs)
– 2²⁴ Selectable Baud Rates
– Asynchronous/Isosynchronous Modes
– Two High-End CAN Controllers (HECC)
– 32-Mailbox Capacity
– Fully Compliant With CAN Protocol,
Version 2.0B
– Five Inter-Integrated Circuit (I2C) Modules
– Multi-Master and Slave Interfaces
– Up to 400 Kbps (Fast Mode)
– 7- and 10-Bit Address Capability
• High-End Timer Lite (HET)
– 12 Programmable I/O Channels:
– 12 High-Resolution Pins
– High-Resolution Share Feature (XOR)
– High-End Timer RAM
– 64-Instruction Capacity
• External Clock Prescale (ECP) Module
– Programmable Low-Frequency External
Clock (CLK)
• 12-Channel, 10-Bit Multi-Buffered ADC
(MibADC)
– 64-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55-µs Minimum Sample and Conversion
Time
– Calibration Mode and Self-Test Features
• Flexible Interrupt Handling
• Expansion Bus Module (EBM)
– Supports 8- and 16-Bit Expansion Bus
Memory Interface Mappings
– 42 I/O Expansion Bus Pins
• 46 Dedicated General-Purpose I/O (GIO) Pins
and 47 Additional Peripheral I/Os
• Sixteen External Interrupts
• On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1 ⁽¹⁾ (JTAG) Test-Access Port
• Available in KGD, HFQ and HKP Packages
(1) The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture specification. Boundary scan is not
supported on this device.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDMI is a trademark of Advanced RISC Machines Limited (ARM).
2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2009–2012, Texas Instruments Incorporated