LM3S818-IQN50-C2 Datasheet, PDF (149/569 Pages) Texas Instruments – LM3S818 Microcontroller

NRND: Not recommended for new designs.
Stellaris^® LM3S818 Microcontroller
4.4
4.5
4.5.1
4.5.1.1
probability of this sequence occurring during normal operation of the TAP controller, it should not
affect normal performance of the JTAG interface.
Initialization and Configuration
After a Power-On-Reset or an external reset (RST), the JTAG pins are automatically configured for
JTAG communication. No user-defined initialization or configuration is needed. However, if the user
application changes these pins to their GPIO function, they must be configured back to their JTAG
functionality before JTAG communication can be restored. This is done by enabling the five JTAG
pins (PB7 and PC[3:0]) for their alternate function using the GPIOAFSEL register. In addition to
enabling the alternate functions, any other changes to the GPIO pad configurations on the five JTAG
pins (PB7 andPC[3:0]) should be reverted to their default settings.
Register Descriptions
There are no APB-accessible registers in the JTAG TAP Controller or Shift Register chains. The
registers within the JTAG controller are all accessed serially through the TAP Controller. The registers
can be broken down into two main categories: Instruction Registers and Data Registers.
Instruction Register (IR)
The JTAG TAP Instruction Register (IR) is a four-bit serial scan chain connected between the JTAG
TDI and TDO pins with a parallel load register. When the TAP Controller is placed in the correct
states, bits can be shifted into the Instruction Register. Once these bits have been shifted into the
chain and updated, they are interpreted as the current instruction. The decode of the Instruction
Register bits is shown in Table 4-3 on page 149. A detailed explanation of each instruction, along
with its associated Data Register, follows.
Table 4-3. JTAG Instruction Register Commands
IR[3:0]
0000
0001
0010
1000
1010
1011
1110
1111
All Others
Instruction
EXTEST
INTEST
SAMPLE / PRELOAD
ABORT
DPACC
APACC
IDCODE
BYPASS
Reserved
Description
Drives the values preloaded into the Boundary Scan Chain by the
SAMPLE/PRELOAD instruction onto the pads.
Drives the values preloaded into the Boundary Scan Chain by the
SAMPLE/PRELOAD instruction into the controller.
Captures the current I/O values and shifts the sampled values out of the
Boundary Scan Chain while new preload data is shifted in.
Shifts data into the ARM Debug Port Abort Register.
Shifts data into and out of the ARM DP Access Register.
Shifts data into and out of the ARM AC Access Register.
Loads manufacturing information defined by the IEEE Standard 1149.1
into the IDCODE chain and shifts it out.
Connects TDI to TDO through a single Shift Register chain.
Defaults to the BYPASS instruction to ensure that TDI is always connected
to TDO.
EXTEST Instruction
The EXTEST instruction is not associated with its own Data Register chain. The EXTEST instruction
uses the data that has been preloaded into the Boundary Scan Data Register using the
SAMPLE/PRELOAD instruction. When the EXTEST instruction is present in the Instruction Register,
the preloaded data in the Boundary Scan Data Register associated with the outputs and output
enables are used to drive the GPIO pads rather than the signals coming from the core. This allows
June 18, 2012
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