LM3S818-IQN50-C2 Datasheet, PDF (146/569 Pages) Texas Instruments – LM3S818 Microcontroller

JTAG Interface
NRND: Not recommended for new designs.
4.3.1.3
4.3.1.4
4.3.1.5
4.3.2
components. During normal operation, TCK is driven by a free-running clock with a nominal 50%
duty cycle. When necessary, TCK can be stopped at 0 or 1 for extended periods of time. While TCK
is stopped at 0 or 1, the state of the TAP controller does not change and data in the JTAG Instruction
and Data Registers is not lost.
By default, the internal pull-up resistor on the TCK pin is enabled after reset. This assures that no
clocking occurs if the pin is not driven from an external source. The internal pull-up and pull-down
resistors can be turned off to save internal power as long as the TCK pin is constantly being driven
by an external source.
Test Mode Select (TMS)
The TMS pin selects the next state of the JTAG TAP controller. TMS is sampled on the rising edge
of TCK. Depending on the current TAP state and the sampled value of TMS, the next state is entered.
Because the TMS pin is sampled on the rising edge of TCK, the IEEE Standard 1149.1 expects the
value on TMS to change on the falling edge of TCK.
Holding TMS high for five consecutive TCK cycles drives the TAP controller state machine to the
Test-Logic-Reset state. When the TAP controller enters the Test-Logic-Reset state, the JTAG
Instruction Register (IR) resets to the default instruction, IDCODE. Therefore, this sequence can
be used as a reset mechanism, similar to asserting TRST. The JTAG Test Access Port state machine
can be seen in its entirety in Figure 4-2 on page 147.
By default, the internal pull-up resistor on the TMS pin is enabled after reset. Changes to the pull-up
resistor settings on GPIO Port C should ensure that the internal pull-up resistor remains enabled
on PC1/TMS; otherwise JTAG communication could be lost.
Test Data Input (TDI)
The TDI pin provides a stream of serial information to the IR chain and the DR chains. TDI is
sampled on the rising edge of TCK and, depending on the current TAP state and the current
instruction, presents this data to the proper shift register chain. Because the TDI pin is sampled on
the rising edge of TCK, the IEEE Standard 1149.1 expects the value on TDI to change on the falling
edge of TCK.
By default, the internal pull-up resistor on the TDI pin is enabled after reset. Changes to the pull-up
resistor settings on GPIO Port C should ensure that the internal pull-up resistor remains enabled
on PC2/TDI; otherwise JTAG communication could be lost.
Test Data Output (TDO)
The TDO pin provides an output stream of serial information from the IR chain or the DR chains.
The value of TDO depends on the current TAP state, the current instruction, and the data in the
chain being accessed. In order to save power when the JTAG port is not being used, the TDO pin
is placed in an inactive drive state when not actively shifting out data. Because TDO can be connected
to the TDI of another controller in a daisy-chain configuration, the IEEE Standard 1149.1 expects
the value on TDO to change on the falling edge of TCK.
By default, the internal pull-up resistor on the TDO pin is enabled after reset. This assures that the
pin remains at a constant logic level when the JTAG port is not being used. The internal pull-up and
pull-down resistors can be turned off to save internal power if a High-Z output value is acceptable
during certain TAP controller states.
JTAG TAP Controller
The JTAG TAP controller state machine is shown in Figure 4-2 on page 147. The TAP controller
state machine is reset to the Test-Logic-Reset state on the assertion of a Power-On-Reset (POR)
146
June 18, 2012
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