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K5A3X40YTC Datasheet, PDF (42/45 Pages) Samsung semiconductor – Multi-Chip Package MEMORY 32M Bit (4Mx8/2Mx16) Dual Bank NOR Flash Memory / 4M(512Kx8/256Kx16) Full CMOS SRAM
K5A3x40YT(B)C
Preliminary
MCP MEMORY
SRAM TIMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS1S=OE=VIL, CS2S=WE=VIH, UB or/and LB=VIL)
tRC
Address
Data Out
tAA
tOH
Previous Data Valid
Data Valid
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)
Address
CS1S
tRC
tAA
tOH
tCO1
CS2S
UB, LB
OE
Data out
High-Z
tCO2
tBA
tOE
tOLZ
tBLZ
tLZ
Data Valid
tHZ
tBHZ
tOHZ
NOTES (READ CYCLE)
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device
interconnection.
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Revision 0.0
November 2002