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GC5016 Datasheet, PDF (84/88 Pages) Texas Instruments – WIDEBAND QUAD DIGITAL DOWN CONVERTER/ UP CONVERTER
GC5016
SLWS142G − JANUARY 2003 − REVISED NOVEMBER 2005
Table 73. Expected Checksum Results
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Configuration Name
TCK10R0.GC101
TCK100R0.GC101
RCK100R0.GC101
TRCK100R0.GC101
Wait Time
(in clocks)
4,000,000
4,000,000
4,000,000
4,000,000
Transmit
0x121D
0x61EF
−
0x15C8
Expected Results
Chan A
−
−
0x64CF
−
Chan B
−
−
0x4747
−
Chan C
−
−
0x7BD9
0x7BD9
Chan D
−
−
0x4747
0xE1CB
19.1.4 Output Test Configuration
In these tests the chip is setup using the internal pattern generator to provide a simple sin wave output regardless
of the input. There is a transmit configuration (tsin_r0) and a receive configuration (rsin_r0). The transmit
configuration outputs a single real tone on each of the four output ports (AO, BO, CO, and DO) at a rate of one new
sample for each clock. The frequencies are 0.0633, 0.0711, 0.1297, and 0.1378 respectively. The receive
configuration outputs one complex tone on each port as I followed by Q followed by 14 zeros. The four frequencies
are 0.0249, 0.0498, 0.0996, and 0.1992 (of Fsout). In both cases, SO can be used to synchronize the capture of the
output if desired - its period is 2^20 clocks. The frequencies have been chosen so that the output is also periodic in
2^20 to avoid glitches at the repetition point. While the output is periodic in a general sense, it is not digitally precise
periodic due to dithering of the NCO. Use a scope to check that output data from GC5016 provides sufficient setup
and hold and signal integrity for the receiving device.
19.1.5 Input Test Configuration
In this configuration (rby_r0), the chip output is the same as the chip input, only delayed by 50 cycles. This test can
be used to be sure that the input is read properly by the GC5016. Use a scope to check that input setup and hold
times are met and that the signal doesn’t have excessive ringing.
19.1.6 Bypass Configuration
A special configuration file can be used to map any 16bit input port to a 16bit output port. This can be used to bypass
the GC5016 logic, but does include a processing delay. Providing In Circuit Test monitoring points at the GC5016
outputs allows for test equipment monitoring.
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