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S70GL01GN00 Datasheet, PDF (74/83 Pages) SPANSION – 3.0 Volt-only Page Mode Flash Memory featuring 110 nm MirrorBit™ Process Technology
Advance Information
AC Characteristics
Erase and Program Operations for Each S29GL512N
Parameter
Description
JEDEC Std.
(Note 6)
tAVAV
tAVWL
tWLAX
tWC
tAS
tASO
tAH
tAHT
Write Cycle Time (Note 1)
Address Setup Time
Address Setup Time to OE# low during toggle bit polling
Address Hold Time
Address Hold Time From CE# or OE# high
during toggle bit polling
tDVWH
tWHDX
tGHWL
tDS
tDH
tCEPH
tOEPH
tGHWL
Data Setup Time
Data Hold Time
CE# High during toggle bit polling
Output Enable High during toggle bit polling
Read Recovery Time Before Write
(OE# High to WE# Low)
tELWL
tWHEH
tWLWH
tWHDL
tCS
tCH
tWP
tWPH
CE# Setup Time
CE# Hold Time
Write Pulse Width
Write Pulse Width High
Write Buffer Program Operation (Note 2, and Note 3)
Speed Options
110
Min
110
Min
0
Min
15
Min
45
Min
0
Min
45
Min
0
Min
20
Min
20
Min
0
Min
0
Min
0
Min
35
Min
30
Typ
240
Effective Write Buffer Program Operation (Note 2, and
Note 4)
Per Word
Typ
15
Accelerated Effective Write Buffer Program Operation
tWHWH1 tWHWH1 (Note 2, and Note 4)
Per Word
Typ
13.5
Program Operation (Note 2)
Word
Typ
60
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
µs
µs
µs
Accelerated Programming Operation (Note 2)
Word
Typ
µs
54
tWHWH2
tWHWH2 Sector Erase Operation (Note 2)
tVHH VHH Rise and Fall Time (Note 1)
tVCS VCC Setup Time (Note 1)
tBUSY Erase/Program Valid to RY/BY# Delay
Typ
0.5
sec
Min
250
ns
Min
50
µs
Min
90
ns
Notes:
1. Not 100% tested.
2. See the Erase And Programming Performance‚ on page 79 for more information.
3. For 1–16 words/1–32 bytes programmed.
4. Effective write buffer specification is based upon a 16-word/32-byte write buffer operation.
5. Unless otherwise indicated, AC specifications the 110 ns speed options are tested with VIO = VCC = 3 V.
6. CE# can be replaced with CE2# when referring to the second die in the package.
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S70GL01GN00 MirrorBitTM Flash
S70GL01GN00_00_A1 June 1, 2005