MT9M114_16 Datasheet, PDF (25/62 Pages) ON Semiconductor – High-Definition (HD) System-On- A-Chip (SOC) Digital Image Sensor

MT9M114: 1/6-Inch 720p High-Definition (HD) System-On-A-Chip (SOC) Dig-
ital Image Sensor
For normal operation of the MT9M114, streams of raw image data from the sensor core
are continuously fed into the color pipeline. The MT9M114 features an automatic color
bar test pattern generation function to emulate sensor images as shown in Figure 22:
“Color Bar Test Pattern,” on page 25. The color bar test pattern is fed to the IFP for testing
the image pipeline without sensor operation.
Color bar test pattern generation can be selected by programming variables. To select
enter test pattern mode R0xC84C = 0x02; to exit this mode R0xC84C must be set to 0x00.
A Change-Config command needs to be issued when switching to CAM mode to enable
test pattern as well as when exiting.
Figure 22: Color Bar Test Pattern
Test Pattern
Flat Field
R0xC84C = 0x02
R0xC84D = 0x01
R0xC84E = 0x01FF
R0xC850 = 0x01FF
R0xC852 = 0x01FF
Load= Change-Config
Changing the values in
0x4E-0x52 will change the
color of the test pattern.
100% Color Bar
R0xC84C = 0x02
R0xC84D = 0x04
Load=Change-Config
Example
Pseudo-Random
R0xC84C = 0x02
R0xC84D = 0x05
Load=Change-Config
Fade-to-Gray
R0xC84C = 0x02
R0xC84D = 0x08
Load = Change-Config
Walking ones 10-bit
R0xC84C = 0x02
R0xC84D = 0x0A
Load = Change-Config
Walking ones 8-bit
R0xC84C = 0x02
R0xC84D = 0x0B
Load = Change-Config
MT9M114/D Rev. 11, 2/16 EN
25
©Semiconductor Components Industries, LLC,2016.