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PXR40 Datasheet, PDF (56/100 Pages) Freescale Semiconductor, Inc – PXR40 Microcontroller
Electrical characteristics
5.4 ESD characteristics
Table 6. ESD ratings1,2
Spec
Characteristic
Symbol
Value
Unit
1 ESD for Human Body Model (HBM)
VHBM
2000
V
2 ESD for Charged Device Model (CDM)
VCDM
750 (corners)
V
500 (other)
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade
Integrated Circuits.
2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification requirements. Complete DC parametric and functional testing shall be performed per applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the
device specification.
5.5 PMC/POR/LVI electrical specifications
Note: For ADC internal resource measurements, see Table 18 in Section 5.9.1 ADC internal resource measurements.
Table 7. PMC operating conditions
Name
Parameter
Condition
Min
Typ
Max Unit Note
VDDREG
VDDREG
VDD33
VDD
Supply voltage VDDREG LDO5V / SMPS5V mode
4.5
5
5.5
V1
5V nominal
Supply voltage VDDREG LDO3V mode
3V nominal
3.0
3.3
3.6
V1
Supply voltage VDDSYN /
VDD33 3.3V nominal
Supply voltage VDD
1.2V nominal
LDO3V mode
—
3.0
3.3
3.6
V2
1.14
1.2
1.32
V3
1 Voltage should be higher than maximum VLVDREG to avoid LVD event
2 Applies to both VDD33 (flash supply) and VDDSYN (PLL supply) pads. Voltage should be higher than maximum VLVD33 to avoid
LVD event
3 Voltage should be higher than maximum VLVD12 to avoid LVD event
NOTE
In the following table, “untrimmed” means “at reset” and “trimmed” means “after reset”.
Table 8. PMC electrical specifications
ID
Name
1 VBG
1a —
2 VDD12OUT
Parameter
Nominal bandgap reference voltage
Untrimmed bandgap reference voltage
Nominal VRC regulated 1.2V output VDD
Min
0.608
VBG – 5%
—
Typ
0.620
VBG
1.2
Max
0.632
VBG + 5%
—
Unit
V
V
V
PXR40 Microcontroller Data Sheet, Rev. 1
56
Freescale Semiconductor